Adjustable Test Pattern Results Latency in Digital Instruments
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Solution Overview
Problem
Digital test instruments with varying results latencies can 'break' working test programs due to increased latency, making it challenging to run existing test programs on newer instruments with different latency characteristics.
Innovation Solution
A digital test instrument with a synchronization unit that provides a no-result indication for a preset number of pattern cycles followed by pass/fail results, allowing the pattern controller to generate sequences of test patterns responsive to pass/fail results and emulating the latency of older instruments, thus ensuring compatibility with original test programs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the operating speed of digital test instruments is increased to achieve high-speed performance, then productivity is improved, but results latency increases causing existing test programs to fail
Solution Approach 1:
The patent applies dynamics by making the results latency configurable and adjustable rather than fixed. The system allows dynamic modification of the latency parameter to match different test program requirements, enabling the same hardware to adapt between high-speed operation and legacy program compatibility modes
Solution Approach 2:
The patent changes the latency parameter from a fixed hardware characteristic to a configurable parameter. By allowing users to set and adjust the results latency value, the system can optimize performance for different test scenarios and maintain compatibility with test programs designed for different latency characteristics
2Adaptability or versatility
If the results latency is reduced to maintain compatibility with existing test programs, then adaptability is improved, but high-speed performance is compromised
Solution Approach 1:
The system dynamically adjusts the results latency based on the specific test program being executed. By making latency configurable, the instrument can switch between different latency modes to match the requirements of various test programs, whether legacy or modern, without being constrained to a single fixed value
Solution Approach 2:
The patent makes the test instrument universal by enabling it to handle both old and new test programs with different latency expectations. The configurable latency parameter allows the same hardware platform to serve multiple functions and support diverse test program requirements
3Device complexity
If test programs are modified to accommodate new instrument latency, then device complexity is reduced, but development cost and time increase
Solution Approach 1:
Instead of modifying test programs to match the instrument's fixed latency, the patent inverts the approach by allowing the instrument to adapt its latency to match the test program's requirements. This eliminates the need for costly and time-consuming program modifications
Data Source
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AI summary
A digital test instrument and a test method provide adjustable results latency. A digital test instrument includes a pattern controller configured to generate a sequence of test patterns, responsive, at least in part, to a pass/fail result, a pattern memory configured to supply the generated sequence of test patterns to a unit under test, a pattern results collection unit configured to receive at least one result value from the unit under test and to determine a pass/fail result for at least one supplied test pattern, and a synchronization unit configured to provide a no-result indication to the pattern controller during a preset number of pattern cycles following the start of a test, the preset number of pattern cycles based on a results latency of the test instrument, and to provide pass/fail results to the pattern controller after the preset number of pattern cycles.