Digital Aging Sensor Using Delay-Line TDC Measurement
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Solution Overview
Problem
Conventional aging sensor solutions for electronic systems fail to provide accurate measurements of circuit path degradation due to signal frequency shifts, leading to potential overestimation of aging and inefficiencies in system adjustments.
Innovation Solution
A digital aging sensor that measures delay differences between unaged and aged delay paths, using a time-to-digital converter (TDC) and self-centering calibration logic to track circuit path aging accurately, while mitigating external disturbances and capturing worst-case signal degradation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional aging sensor solutions measure aging based on signal frequency shift, then aging information can be obtained, but measurement accuracy deteriorates due to overestimation of aging
Solution Approach 1:
The patent changes the measurement parameter from signal frequency shift to signal time delay. By measuring the time delay of signals propagating through reference and aged delay lines, the sensor achieves accurate aging detection without the overestimation problems associated with frequency-based methods. The time delay measurement directly reflects the actual aging-induced degradation of the circuit path.
2Measurement precision
If a digital aging sensor measures delay differences between unaged and aged delay paths, then accurate aging tracking is achieved, but device complexity increases due to additional circuit components
Solution Approach 1:
The patent creates a reference delay line that copies the structure and characteristics of the aged delay path. This reference delay line remains unaged and serves as a baseline for comparison. By copying the critical path structure into the reference delay line, the sensor can accurately measure aging effects without requiring complex analysis circuits, as the comparison is made between identical structures in different aging states.
Solution Approach 2:
The sensor circuit is segmented into distinct functional blocks: delay lines for signal propagation, a time-to-digital converter for measurement, and calibration logic for accuracy. This segmentation allows each component to be optimized independently and simplifies the overall design by dividing the complex measurement task into manageable subsystems that can be implemented using standard digital logic components.
3Adaptability or versatility
If the aging sensor operates across varying temperature, voltage, and frequency ranges, then adaptability improves, but measurement stability deteriorates due to external disturbances
Solution Approach 1:
The patent incorporates calibration logic that uses feedback mechanisms to compensate for environmental variations. The self-centering calibration logic adjusts the reference delay line settings based on measured deviations caused by temperature, voltage, or frequency changes. This feedback loop maintains measurement stability across varying operating conditions by continuously correcting for external disturbances.
Solution Approach 2:
The aging sensor performs self-calibration using its own internal resources without requiring external calibration equipment. The self-centering calibration logic automatically adjusts the sensor's operating parameters to maintain accuracy across different temperature, voltage, and frequency conditions. This self-service capability enables the sensor to adapt to varying operating ranges while maintaining measurement stability.
Data Source
AI summary
Some embodiments include an apparatus having a circuit, the circuit including an output node to provide a signal; a first delay line including an input node coupled to the output node of the circuit, and an output node; a second delay line including an input node coupled to the output node of the circuit, and an output node; and time-to-digital converter (TDC) including a first input node coupled to the output node of the first delay line, and a second input node coupled to the output node of the second delay line.