ALD Chamber Pressure Dynamics for Plasma Film Removal

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Solution Overview

Problem

Automatic layer deposition (ALD) processes face challenges in preventing particle generation during the deposition process, which affects the quality of the films formed.

Innovation Solution

The method involves varying the pressure of the processing chamber while forming a plasma of a purge gas to remove deposited films, using a sequence of pressure changes to maintain plasma formation and prevent particle formation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a plasma of a purge gas is formed in the processing chamber to remove deposited films, then the deposited materials are effectively removed from chamber surfaces, but particles are generated during the deposition process

Engineering Contradiction:
Improvefilm qualityVSAvoidparticle generation
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent applies dynamics by varying the pressure of the processing chamber during plasma formation. Instead of maintaining constant pressure, the system dynamically adjusts pressure conditions to optimize both the removal of deposited films and the prevention of particle generation. This dynamic pressure control allows the plasma to effectively clean chamber surfaces while minimizing particle formation during the deposition process.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent utilizes parameter changes by modifying pressure conditions during plasma-based film removal. By changing the pressure parameter of the processing chamber while maintaining plasma formation, the system achieves effective removal of deposited materials without generating particles. This parameter adjustment optimizes the plasma's cleaning effectiveness while controlling harmful side effects.

Inventive Principle:
Principle #35Parameter changes

2Object-generated harmful factors

If pressure of the processing chamber is varied to remove deposited films with plasma, then particle generation is prevented, but the process complexity increases

Engineering Contradiction:
Improveparticle generationVSAvoidprocess control complexity
Core Design Contradiction:
Object-generated harmful factorsVSDevice complexity

Solution Approach 1:

The patent employs parameter changes by systematically varying the pressure of the processing chamber during plasma formation. This controlled parameter adjustment enables effective removal of deposited films while preventing particle generation. The pressure variations are implemented through coordinated control of gas supply and exhaust systems, managing the added process complexity through structured parameter management.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent maintains continuity of useful action by keeping plasma formation continuous while varying pressure conditions. Rather than interrupting the plasma process to adjust parameters, the system continuously maintains plasma formation while dynamically adjusting pressure, ensuring uninterrupted film removal effectiveness and consistent particle prevention throughout the process.

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively reduces particle generation, improving the quality of the deposited films by ensuring thorough removal of deposited materials from the chamber surfaces.

Implementation Method 1

a plasma of a purge gas is formed in the processing chamber, the varying including removing a film deposited in the processing chamber, with the formed plasma

Methodology Applied
Scientific EffectPlasma: Plasma

Data Source

PatentUS11414753B2Processing method
Publication Date: 2022.08.16 TOKYO ELECTRON LTD
  • US11414753B2 patent drawing
  • US11414753B2 patent drawing
  • US11414753B2 patent drawing

AI summary

A processing method according to one aspect of the present disclosure includes varying pressure of a processing chamber in a state in which a plasma of a purge gas is formed in the processing chamber, the varying including removing a film deposited in the processing chamber, with the formed plasma.