AMOLED Array Substrate Repair Line Layout for Open-Circuit Pixels
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Solution Overview
Problem
The manufacturing process of array substrates with active-matrix organic light-emitting diodes (AMOLEDs) is complex, leading to defects such as open-circuit points in the pixel driving circuits, which are difficult to accurately detect and repair.
Innovation Solution
The array substrate incorporates an open-circuit repair structure with a repair line that overlaps with the anode of the OLED, allowing for effective repair of open-circuit points by coupling the anode with the drain of the driving thin film transistor in an adjacent pixel unit, using deep penetration laser welding.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If the manufacturing process of AMOLED array substrates is made complex to achieve high brightness and full viewing angle, then display performance is improved, but the occurrence of open-circuit defects in pixel driving circuits increases and becomes difficult to detect and repair
Solution Approach 1:
The patent applies preliminary action by pre-configuring a repair line structure during manufacturing that can be activated later. The repair line is positioned to overlap with the anode extension line, creating a predetermined repair path that can be used if open-circuit defects occur, thus preventing complete device failure while maintaining the complex manufacturing process needed for high display performance
Solution Approach 2:
The patent uses the repair line as an intermediary element between the driving thin film transistor and the OLED anode. This repair line serves as a mediator that can be laser-welded to restore electrical connectivity when open-circuit defects occur, allowing repair without affecting other components or requiring complete device disassembly
2Ease of manufacture
If traditional detection and repair methods are used for open-circuit points, then manufacturing process simplicity is maintained, but detection accuracy and repair effectiveness are insufficient
Solution Approach 1:
The patent employs optical detection methods that utilize light reflection and absorption characteristics to identify open-circuit points. By using optical properties (analogous to color changes) of the repair line and surrounding structures, the system can accurately locate defects without complex electrical testing, achieving both simplicity and precision
Solution Approach 2:
The repair line structure serves as an intermediary that facilitates both detection and repair. Its specific positioning and structural characteristics enable it to be detected optically and then used as a target for laser welding, combining detection accuracy with repair effectiveness in a unified structure
3Reliability
If repair operations are performed on open-circuit defects, then device reliability is improved, but manufacturing time and process complexity increase
Solution Approach 1:
The repair line is pre-positioned and pre-configured during manufacturing, so that when an open-circuit defect occurs, the repair process can immediately begin without needing to design or create the repair path. This preliminary preparation significantly reduces repair time while restoring device reliability
Solution Approach 2:
The patent replaces traditional mechanical or electrical repair methods with laser welding technology. The laser welding process can quickly fuse the repair line to the anode extension line without requiring complex mechanical operations or lengthy electrical testing, thus reducing repair time while ensuring reliable electrical connectivity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables reliable repair of open-circuit defects in the pixel driving circuits without affecting other components, ensuring the normal operation of the array substrate and improving the manufacturing efficiency of AMOLED displays.
Implementation Method 1
using deep penetration laser welding
Data Source
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AI summary
Provided in the present disclosure is an array substrate, comprising: a base substrate; and multiple pixel units arranged in an array on said base substrate, each pixel unit comprising: a broken circuit repair structure, an OLED and a pixel driver circuit, the broken circuit repair structure being provided with a repair line; an orthographic projection of the repair line onto the base substrate partly or fully coincides with an orthographic projection of an anode of the OLED onto the base substrate, forming a coincident region; a broken circuit repair point is located in the coincident region.