Analog Switch Gate Modulation for Lower Off-State GIDL

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Solution Overview

Problem

Existing CMOS switches suffer from significant gate-induced drain leakage (GIDL) current when in the off-state, which affects the performance of systems utilizing multiple switches, particularly in analog applications where combined leakage currents can impact performance.

Innovation Solution

An analog switch design featuring NMOS and PMOS circuits in parallel, with buffer transistors and a control circuit that applies modulated gate voltages alternating between supply voltage and GIDL mitigation voltage based on switch state to reduce GIDL current.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If conventional CMOS switches are used in off-state, then the device structure is simple, but gate-induced drain leakage current is significant

Engineering Contradiction:
Improvedevice structureVSAvoidgate-induced drain leakage current
Core Design Contradiction:
Device complexityVSObject-generated harmful factors

Solution Approach 1:

The patent segments the single transistor structure into two separate transistors (first transistor and second transistor) with their sources connected together. This segmentation allows independent control of gate voltages to mitigate GIDL current while maintaining the basic switch functionality, resolving the contradiction between structural simplicity and leakage reduction.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the voltage parameters applied to the gates of the two transistors. By applying different voltages to the first and second gates independently, the patent optimizes the electric field distribution to reduce GIDL current. This parameter change approach allows leakage reduction without significantly complicating the device structure.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If multiple CMOS switches are coupled to a common terminal, then the system functionality is enhanced, but combined leakage current scales and significantly impacts performance

Engineering Contradiction:
Improvesystem functionalityVSAvoidcombined leakage current
Core Design Contradiction:
Adaptability or versatilityVSObject-generated harmful factors

Solution Approach 1:

By segmenting each switch into two transistors with independent gate control, the patent enables individual optimization of leakage current for each switch. When multiple switches are coupled to a common terminal, this segmentation allows each switch to independently minimize its leakage contribution, preventing the combined leakage from scaling proportionally with the number of switches.

Inventive Principle:
Principle #1Segmentation

3Object-generated harmful factors

If buffer transistors are added to reduce GIDL current, then leakage current is reduced, but device complexity increases

Engineering Contradiction:
Improveleakage currentVSAvoiddevice structure
Core Design Contradiction:
Object-generated harmful factorsVSDevice complexity

Solution Approach 1:

The patent makes the two transistors serve multiple functions: they act as the primary switching elements while simultaneously functioning as leakage mitigation devices through their coordinated operation. This multi-functionality approach reduces leakage current without adding separate buffer transistor structures, thereby avoiding excessive complexity increase.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentEP3272011B1Analog switch having reduced gate-induced drain leakage
Publication Date: 2019.06.26 XILINX INC
  • EP3272011B1 patent drawingFigure 1A~1B
  • EP3272011B1 patent drawingFigure 2
  • EP3272011B1 patent drawingFigure 3

AI summary

In an example, an apparatus includes an analog switch (102) having an n-type metal oxide semiconductor (NMOS) circuit (202) in parallel with a p-type metal oxide semiconductor (PMOS) circuit (204) between a switch input and a switch output. The analog switch (102) is responsive to an enable signal that determines switch state thereof. The NMOS circuit (202) includes a switch N- channel transistor coupled to a buffer N-channel transistor, a gate of the switch N-channel transistor coupled to the enable signal and a gate of the buffer N- channel transistor coupled to a modulated N-channel gate voltage. The PMOS circuit (204) including a switch P-channel transistor coupled to a buffer P- channel transistor, a gate of the switch P-channel transistor coupled to a complement of the enable signal and a gate of the buffer P-channel transistor coupled to a modulated P-channel gate voltage. A control circuit (208) is coupled to the analog switch (102) to provide the modulated N-channel and modulated P-channel gate voltages each of which alternates between a respective supply voltage and a respective gate induced drain leakage (GIDL) mitigation voltage based on the switch state.