Analog Circuit Test Patterns for Higher Defect Detection Coverage

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Solution Overview

Problem

Detecting defects in analog circuits is challenging due to the lack of well-defined signal values and deviations, making randomly generated test patterns ineffective for identifying specific defects, and traditional simulation methods are computationally expensive.

Innovation Solution

Employing a combination of alternating-current (AC) simulation, surrogate models like machine learning-based neural networks, and parallel optimization strategies to generate test patterns that maximize the difference between nominal and defective circuit responses, thereby enhancing defect detection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If randomly generated waveforms are used as test patterns, then the testing process is simple and fast, but defect detection coverage is insufficient especially for defects producing weak deviations

Engineering Contradiction:

Improvetesting speedVSAvoiddefect detection coverage

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

The system performs preliminary analysis by simulating circuit responses with both nominal and defective parameters before final test pattern generation. This preliminary simulation phase identifies critical test conditions that maximize defect detectability, allowing the system to pre-determine optimal test patterns rather than relying on random generation.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The system varies test pattern parameters systematically based on simulated defect responses. By analyzing how different input signal characteristics affect the magnitude of defect-induced deviations, the system adjusts test pattern parameters to maximize the difference between nominal and defective responses, thereby improving detection coverage for subtle defects.

Inventive Principle:

Principle #35Parameter changes

2Reliability

If specific test patterns are designed to detect particular defects, then defect detection reliability improves, but the complexity of test pattern generation increases

Engineering Contradiction:

Improvedefect detection reliabilityVSAvoidtest pattern generation complexity

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The system automatically generates optimized test patterns through self-service automation. The computer system performs simulations, analyzes defect responses, and autonomously determines optimal test patterns without requiring manual intervention or complex external tools, thereby reducing operational complexity while maintaining high detection reliability.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The system replaces manual test pattern design processes with automated computational methods. Instead of relying on manual analysis and design of test patterns, the system uses computer-based simulation and optimization algorithms to automatically generate test patterns, substituting mechanical/manual processes with automated computational ones.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If transient simulation is used to accurately model circuit behavior, then simulation accuracy improves, but computational cost increases significantly

Engineering Contradiction:

Improvesimulation accuracyVSAvoidcomputational cost

Core Design Contradiction:

Measurement precisionVSUse of energy by stationary object

Solution Approach 1:

The system applies partial transient simulation only where necessary - specifically for identifying critical test conditions and analyzing defective responses. For routine test pattern generation and normal operation analysis, the system uses more efficient AC simulation methods. This selective application of computationally intensive transient simulation reduces overall computational cost while maintaining accuracy where it matters most.

Inventive Principle:

Principle #16Partial or excessive action

Solution Approach 2:

The system performs preliminary AC simulations to identify potential defect conditions and critical test frequencies before conducting detailed transient simulations. This preliminary filtering allows the system to focus computationally expensive transient analysis only on the most promising test cases, significantly reducing total computational cost while preserving simulation accuracy for critical analyses.

Inventive Principle:

Principle #10Preliminary action

Data Source

PatentUS12626043B2Automatic test pattern generation to increase coverage in detecting defects in analog circuits

Publication Date: 2026.05.12 SYNOPSYS INC

AI summary

Test patterns are generated to test for a specified defect in an analog circuit by applying a succession of different strategies. Each strategy efficiently determines nominal responses and defect responses of the analog circuit to trial test patterns. The nominal response is a response of the analog circuit without the specified defect, and the defect response is a response of the analog circuit with the specified defect. Test patterns are selected based on differences between the nominal and defect responses.