Analog Circuit Testing TRIZ Cases
- Analog DFT Architecture Using Functional Pins for Shared Test Access
Functional analog pins are reused through a shared test bus to access multiple analog circuits, cutting dedicated test pins and test time.
- Temperature Measurement Circuit With Analog BIST Voltage Monitoring
Analog BIST monitors band-gap, reference, and bias voltages to catch sensor faults while preserving accurate on-chip temperature measurement.
- On-Chip Temperature Sensing Circuit With Analog BIST Feedback
Band-gap, reference, and bias voltages are self-checked to keep on-chip temperature sensing accurate and prevent circuit degradation.
- Analog Monitoring Circuit ABIST Using Ramp Signal Time Windows
Ramp-signal timing replaces multi-clock and filter-based ABIST, enabling faster analog monitoring tests with lower power and less chip area.
- Analog Test Circuit Isolation During Power-Up Switching
A switching circuit stays open during power-up to prevent analog-node shorts and stabilize external voltage testing.
- Temperature Measurement Circuit With Analog BIST Fault Diagnosis
Analog BIST checks band-gap, reference, and bias voltages to catch on-chip temperature sensor faults before bad readings damage ICs.
- Analog Test Bus Error Detection in Linear Analog Circuits
An integrated analog test bus detects and corrects transient and parametric faults in linear analog circuits with minimal hardware overhead.
- ADC Input Fault Detection Using High-Impedance Stimulus Injection
A pulsed stimulus injected through high impedance lets ADC inputs detect open-circuit and signal-path faults without disrupting analog measurement.
- Dual-ADC Failure Determination During Continuous Signal Conversion
A switched second ADC compares equivalent signals with a continuously running ADC to detect conversion failure without interrupting measurement.