Event-Driven Circuit Simulation Using S-Domain Transfer Functions
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Solution Overview
Problem
Existing circuit simulation tools face challenges in accurately simulating switching circuits due to the use of numerical integration methods, which result in low accuracy and long computation times, especially when dealing with abrupt changes in circuit configurations.
Innovation Solution
The method employs an event-driven approach using s-domain transfer functions and basis functions to calculate the response of electrical circuits before and after switching, allowing for accurate and efficient simulation by updating the output only when the input stimulus changes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If numerical integration method is used to simulate switching circuit, then simulation accuracy can be maintained, but simulation time becomes excessively long
Solution Approach 1:
The simulation time period is divided into multiple small intervals, and within each interval, the circuit configuration is assumed to remain constant. This allows the use of efficient analytical methods within each segment while maintaining overall accuracy, resolving the contradiction between simulation speed and accuracy by avoiding the need for extremely fine global time steps that would otherwise be required to capture switching transients accurately
Solution Approach 2:
The circuit response is calculated in advance for each time interval using analytical solutions based on the circuit configuration at the beginning of that interval. By pre-calculating responses for each segment before summing them up, the method avoids the computational burden of iterative numerical integration while maintaining accuracy, thus reducing simulation time without sacrificing precision
2Measurement precision
If fine time division is used to obtain accurate response, then simulation accuracy improves, but computation time increases significantly
Solution Approach 1:
The method changes the fundamental parameter from time-step size to number of switching events. Instead of using extremely fine time divisions to capture switching transients, the solution adapts to the actual switching behavior by calculating responses analytically for each switching event. This parameter transformation allows accurate capture of abrupt changes without requiring proportionally finer time resolution, thus maintaining accuracy while improving computation speed
3Loss of time
If event-driven method is used to update output only when input changes, then computation time is reduced, but handling abrupt switching changes becomes difficult
Solution Approach 1:
The method dynamically adapts to switching events by detecting configuration changes and adjusting the calculation intervals accordingly. When switching occurs, the simulation automatically transitions to a new calculation phase with updated circuit parameters. This dynamic adaptation allows the event-driven approach to reliably handle abrupt switching transients while maintaining computational efficiency, as the system only recalculates when necessary rather than using fixed fine time steps throughout
Data Source
AI summary
Disclosed is a method of simulating a switching electrical circuit, including one or more reactive elements and one or more switches. The method includes receiving an electrical circuit including one or more reactive elements and one or more switches and a stimulus expressed in a form of a linear combination of one or more basis functions; calculating a response of the electrical circuit before the switching in a form of a linear combination of one or more basis functions, using an s-domain transfer function of the electrical circuit before the switching, initial values of the reactive elements before the switching, and the stimulus expressed in a form of a linear combination of one or more basis functions; and calculating a response of the electrical circuit after the switching in a form of a linear combination of one or more basis functions, using an s-domain transfer function of the electrical circuit after the switching and initial values of the reactive elements after the switching.