Analysis Chip Positioning and Reflectivity Detection for Sensor Reliability
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Solution Overview
Problem
The surface plasmon resonance fluorescence analysis method and device face issues with abnormal measurement results due to temperature and humidity changes causing condensation, and physical damage such as scratches on the sensor chip during handling.
Innovation Solution
The method and device incorporate a control processing part that adjusts the position of the analysis chip and detects abnormalities by analyzing the quantity of reflected light, allowing for the prevention of abnormal measurements by correcting for condensation and physical damage through temperature control and position adjustment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If the sensor chip is opened before returning to room temperature, then the measurement process can be started earlier, but condensation or mist is formed on the sensor chip due to temperature difference, resulting in abnormal measurement results
Solution Approach 1:
The sensor chip is pre-heated to room temperature using a heating unit before the measurement process begins. This preliminary temperature equalization prevents condensation formation when the chip is opened, allowing the measurement to start without waiting for natural cooling while maintaining measurement reliability.
Solution Approach 2:
A heating unit is introduced as an intermediary device between the refrigeration storage and the measurement environment. This mediator actively controls the temperature transition, preventing condensation by maintaining the chip at room temperature before opening, thus resolving the contradiction between speed and reliability.
2Ease of operation
If the sensor chip is handled manually, then the operation is simple and direct, but the sensor chip may get dirty or scratched, resulting in abnormal measurement results
Solution Approach 1:
The manual mechanical handling of the sensor chip is replaced with an automated conveyance mechanism. The conveyance unit automatically transports the chip between storage and measurement positions, eliminating direct human contact and preventing contamination or physical damage while maintaining operational simplicity through automation.
Solution Approach 2:
The system performs self-service by automatically conveying and positioning the sensor chip without requiring manual intervention. The conveyance unit handles the chip throughout the process, making the system independent of human operation for chip handling while ensuring chip integrity.
3Productivity
If the position of the analysis chip is not adjusted, then the measurement process is faster, but the measurement position may be inaccurate, resulting in abnormal measurement results
Solution Approach 1:
A detection unit provides feedback on the actual position of the analysis chip. This feedback information is used by the control unit to automatically adjust the chip position to the correct measurement location, ensuring positioning accuracy while maintaining measurement speed through automated correction.
Solution Approach 2:
A detection unit and control unit are introduced as intermediaries between the conveyance mechanism and the measurement process. These intermediaries detect the chip position and automatically adjust it, serving as a bridge that connects rapid conveyance with precise positioning requirements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively prevents abnormal measurement results by accurately positioning the chip and correcting for environmental and handling-induced issues, ensuring reliable detection without additional hardware or steps, thus maintaining cost-effectiveness and reducing waste.
Implementation Method 1
when the metal film is irradiated with excitation light from an excitation light irradiation unit through the prism at an angle at which surface plasmon resonance occurs, localized-field light (enhanced electric field) can be generated on the surface of the metal film
Implementation Method 2
This localized-field light excites a fluorescent substance that labels a substance to be detected captured on the metal film. Therefore, it is possible to detect the presence of the substance to be detected or the amount thereof by detecting fluorescence emitted from the fluorescent substance.
Implementation Method 3
a control processing part that adjusts the position of the analysis chip and detects abnormalities by analyzing the quantity of reflected light
Data Source
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AI summary
To provide an analysis method and an analysis device that can easily prevent an abnormal measurement result from being detected. An analysis method for detecting an amount of a substance to be measured by irradiating an analysis chip containing the substance to be measured with detection light and detecting a quantity of light output from the analysis chip, the analysis method including: a step of irradiating an incident surface of the analysis chip and another surface adjacent to the incident surface with the detection light while changing a relative position of the detection light with respect to the analysis chip, detecting reflected light from the incident surface of the analysis chip, and acquiring information on a position of the analysis chip from a relationship between a quantity of the reflected light detected and the relative position, wherein the analysis method further including: an abnormality determination step of determining that the analysis chip is abnormal in the case where a quantity of target reflected light is equal to or lower than a predetermined light quantity, the quantity of the target reflected light being a light quantity to be detected when the analysis chip is located at a position where a total beam diameter of the detection light is incident on the incident surface.