Phase-Affecting Property Measurements TRIZ Cases
- Standing Wave Interferometric Microscope with Two-Way Beam Splitter
A wide-field interferometric microscope uses a standing wave illumination pattern and a two-way beam splitter to generate sinusoidal modulation for depth-resolved localization.
- Universal Refractometer 3D Polynomial Scale Temperature Compensation
A universal refractometer employs a single 3D polynomial scale to correlate refractive index, concentration, and temperature for precise liquid analysis.
- THz Quantum Cascade Laser Self-Mixing Interferometry
Self-mixing interferometry in a THz quantum cascade laser detects phase and amplitude changes to overcome low signal-to-noise ratios in materials analysis.
- Photonic Chip Interferometer Phase Adjuster for Precision Optical Measurement
A photonic chip interferometer uses a phase adjusting unit to vary signal phase differences between waveguides.
- Scanning Interferometry Surface Analysis Model Correlation
Compare scanning interferometry signals with model signals to identify surface-height offsets and determine test object parameters.
- ESPI Fiber-Optic Interferometer for EM Field Displacement Measurement
A fiber-optic ESPI system directs laser beams to measure material displacement remotely.
- LED Optical Detection for Fluid Contaminants
An LED and photodetector array measure light transmission to identify material presence in gases and fluids.
- Optical Interference Measurement System Synchronous Platform Alignment
A measurement system synchronously moves a reference sample and test sample on a single detection platform to maintain optical alignment.
- Negatively-Refractive Focusing Structure for Axial Magnification
Coordinate inversion and parameter changes enable axial magnification greater than one in transformation optics devices.
- Flow Cell Polymer Monitoring via Refractive Index and Scattering
A flow cell uses refractive index and light scattering sensors to measure polymer concentration and molecular size in solvents.
- Variable Angle Refractive Index Measurement for Thin Films
Distributed Bragg reflectors enable accurate thin film measurement without oblique incident angles, resolving precision and flexibility trade-offs.
- Tomographic Refractive Index Mapping in Biological Samples
Phase-shifting interferometry measures spatial refractive index variations without liquid immersion, preserving cellular structure integrity.
- Planar Waveguide Optofluidic Sensor for Refractive Index Detection
A planar waveguide optofluidic sensor detects fluid refractive index using an evanescent field interaction within a microfluidic channel.
- Vertical Interrogation Biophotonic Biosensor
Vertical optical interrogation of biophotonic structures detects refractive index variations without complex fiber coupling, reducing manufacturing costs.
- Infrared Photoresist Inspection for Uniformity
A broadband infrared inspection method measures spectral properties of patterned photoresist to compute the complex refractive index.
- Lens Meter Frame Support Cutout for Progressive Lens Measurement
A lens meter uses a segmented frame support with a cutout and movable pad to stabilize half-eye frames during optical testing.
- Position Detection Device Stray Light Suppression
A position detection device suppresses higher order diffracted light using specific grating pitch and incidence angle constraints.
- Optical Pickup Pulse Signal Segmentation for Particle Counting
An optical pickup generates light reception level signals to count particles based on pulse extreme value points.
- Evanescent Field Subsea Fluid Monitoring
Optical fiber waveguide detects fluid contaminants via evanescent field absorption, enabling reliable monitoring under high pressure.
- Interferometric Device Phase Control Infrared Spectroscopy
A tunable laser interferometer generates differential signals to determine sample refractive index spectra.
- Light Field Sensor Optical Measurement Device
A light field sensor captures optical characteristics using a microlens array and photoreceptor grid.
- Optical Ice Sensor Using Total Internal Reflection
Total internal reflection redirects light at the interface to measure ice thickness without compromising wing structural integrity.
- Analysis Chip Positioning and Reflectivity Detection for Sensor Reliability
A control processing part adjusts analysis chip position and detects surface abnormalities via reflected light quantity.
- Lensless Optical Reconstruction for Cell Internal Structure
Reconstructs optical properties of diffracting objects at variable heights to distinguish nucleus from cytoplasm without complex lenses.