Analyzing Chamber Leakage Ion Beam Detector

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Solution Overview

Problem

Conventional mass analyzers suffer from damage to their inner sidewalls due to ion beam leakage through gaps in the shielding section, leading to a deterioration of vacuum quality and inaccurate ion extraction.

Innovation Solution

An analyzing chamber with a shielding section and a detector is implemented, where the detector intercepts and measures ion beam leakage between the shielding section and the sidewall, preventing damage by generating an electrical signal to deactivate the ion beam entry when leakage is detected.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If a shielding section is installed to protect the sidewall from ion beam damage, then the sidewall is protected from direct ion beam impact, but ion beam leakage through gaps in the shielding section still causes damage to the sidewall

Engineering Contradiction:
Improveion beam damage to sidewallVSAvoidvacuum quality
Core Design Contradiction:
Object-affected harmful factorsVSReliability

Solution Approach 1:

A detector is introduced as an intermediary component between the shielding section and the sidewall. The detector intercepts leaked ion beams before they reach the sidewall, converting the harmful ion beam energy into electrical signals that trigger protective actions, thus preventing direct damage to the sidewall while maintaining vacuum integrity

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system implements a feedback mechanism where the detector continuously monitors for ion beam leakage and sends signals to the control unit. When leakage is detected, the control unit deactivates the ion beam entry by closing the gate valve, creating a closed-loop protection system that maintains vacuum quality while preventing sidewall damage

Inventive Principle:
Principle #23Feedback

2Object-affected harmful factors

If the gate valve is deactivated to prevent ion beam entry when leakage is detected, then sidewall damage is prevented, but the ion implantation process is interrupted

Engineering Contradiction:
Improvesidewall damageVSAvoidion implantation process continuity
Core Design Contradiction:
Object-affected harmful factorsVSProductivity

Solution Approach 1:

The protection system uses partial action by selectively blocking ion beam entry only when and where leakage is detected, rather than continuously blocking all ion beams. The detector targets specific leakage paths, allowing the ion implantation process to continue normally during most operation cycles while providing protective intervention only when necessary

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The system performs self-diagnosis and self-protection through the detector that automatically monitors for leakage conditions and triggers the gate valve closure without external intervention. This self-service capability enables rapid response to leakage events, minimizing process interruption time while maintaining sidewall protection

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This setup effectively reduces and prevents ion beam-induced damage to the sidewall, maintaining the vacuum integrity and ensuring accurate ion extraction by detecting and addressing leakage before it causes harm.

Implementation Method 1

the detector may be interposed between the shielding section and the sidewall of the body and may detect a leakage ion beam leaked through the shielding section from the space of the body

Methodology Applied
Scientific EffectIon beam detection: Ion Beam

Implementation Method 2

a magnet (not shown) installed in the analyzing chamber 23a and generating a magnetic field for extracting ions from the ion beam

Methodology Applied
Scientific EffectMagnetic field generation: Magnetic Field

Data Source

PatentUS7531792B2Analyzing chamber including a leakage ion beam detector and mass analyzer including the same
Publication Date: 2009.05.12 SAMSUNG ELECTRONICS CO LTD
  • US7531792B2 patent drawing
  • US7531792B2 patent drawing
  • US7531792B2 patent drawing

AI summary

In an analyzing chamber for a mass analyzer, a body of the analyzing chamber may include an inlet through which an ion beam enters and an outlet through which the ion beam leaves. A shielding section may be installed on a sidewall. The shielding section may prevent the ion beam traveling along a path in the body from causing damage to the sidewall of the body. A detector may be interposed between the sidewall of the body and the shielding section. The detector may detect an ion beam leaking through the shielding section. Accordingly, damage to the sidewall of the body may be sufficiently reduced and/or prevented.