Angled Conductive Layers in Semiconductor Storage Devices

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Solution Overview

Problem

Current semiconductor storage devices face challenges in achieving high integration and efficient manufacturing processes, particularly in forming stacked conductive layers and contacts without short circuits and increasing the number of manufacturing steps.

Innovation Solution

The semiconductor storage device employs a configuration with stacked memory cell arrays and conductive layers, where the conductive layers in the hookup regions are angled and insulated, and via holes are formed selectively to align the end portions of sacrificial layers, allowing for high integration while preventing short circuits and reducing manufacturing complexity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If stacked conductive layers and contacts are formed in conventional semiconductor storage devices, then integration density is improved, but the number of manufacturing steps increases and short circuits may occur

Engineering Contradiction:
Improveintegration densityVSAvoidnumber of manufacturing steps
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent forms angled conductive layers and insulating layers in a predetermined sequence before final contact formation. The insulating layers are prepared in advance with specific angles to guide subsequent conductive layer deposition, preventing short circuits before they can occur during final assembly.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent introduces insulating layers as intermediary elements between stacked conductive layers and contacts. These insulating layers act as mediators that prevent direct contact between conductive elements, eliminating short circuit risks while maintaining the stacked configuration for high integration.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If stacked conductive layers are formed with precise alignment, then short circuits are prevented, but manufacturing precision requirements increase

Engineering Contradiction:
Improveshort circuit preventionVSAvoidalignment precision
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent employs angled conductive layers and insulating layers with specific inclination angles rather than vertical stacking. This angular configuration provides natural alignment guidance and tolerance, reducing the precision requirements while ensuring proper positioning and preventing short circuits between stacked elements.

Inventive Principle:
Principle #14Spheroidality (Curvature)

3Quantity of substance

If the number of stacked memory cell arrays is increased, then integration is improved, but manufacturing complexity increases

Engineering Contradiction:
ImproveintegrationVSAvoidmanufacturing complexity
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

The patent divides the stacked structure into modular units with repeating patterns of conductive layers and insulating layers at specific angles. This segmentation allows standardized manufacturing processes to be applied repeatedly, reducing overall manufacturing complexity even as the number of stacked arrays increases.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS11587944B2Semiconductor storage device
Publication Date: 2023.02.21 KIOXIA CORP
  • US11587944B2 patent drawing
  • US11587944B2 patent drawing
  • US11587944B2 patent drawing

AI summary

A semiconductor storage device includes a substrate with a memory cell region and a first region to one side of the memory cell region. A first memory cell layer is on the substrate. A second memory cell layer is between the first memory cell layer and the substrate. A plurality of first conductive layers are stacked on each other in the first memory cell layer. A plurality of second conductive layers are stacked on each other in the second memory cell layer. A plurality of first contacts are above the first region of the substrate, extending through second conductive layer from the substrate to the first memory cell layer. The contacts are electrically insulated from the second conductive layers and electrically connected to ends of the first conductive layers in the first region.