Angled Sidewall Heaters for Resistive Memory Thermal Isolation

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Solution Overview

Problem

Resistive memory cells, such as phase change memory cells, experience thermal disturbance when programmed, leading to undesired changes in adjacent cells, reducing reliability and causing data loss.

Innovation Solution

The implementation of resistive memory cells with heaters having angled sidewalls, which reduces thermal disturbance between adjacent cells by varying the distance and dielectric interfaces, thereby enhancing thermal diffusion characteristics and immunity to data loss.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If memory cells are programmed using conventional heaters, then programming function is achieved, but thermal disturbance occurs in adjacent cells causing data loss

Engineering Contradiction:
Improvedata retention reliabilityVSAvoidthermal disturbance
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The heater structure transitions from a conventional symmetric configuration to an asymmetric L-shaped configuration with a vertical portion and a horizontal portion. This asymmetric design creates different distances from adjacent memory cells, with the horizontal portion positioned farther away to reduce thermal coupling and minimize thermal disturbance to neighboring cells while maintaining effective heating of the target phase change material.

Inventive Principle:
Principle #4Asymmetry

Solution Approach 2:

The heater design extends from a simple planar structure into three-dimensional space by adding both vertical and horizontal portions at different elevations. This dimensional extension allows the heater to target specific memory cells more precisely while creating thermal isolation from adjacent cells through strategic positioning in the vertical dimension, thereby reducing unwanted thermal effects.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Speed

If heater size is increased to improve heating efficiency, then programming speed improves, but thermal disturbance to adjacent cells increases

Engineering Contradiction:
Improveprogramming speedVSAvoidthermal disturbance
Core Design Contradiction:
SpeedVSObject-affected harmful factors

Solution Approach 1:

The L-shaped heater concentrates heating capability locally at the intersection region where the vertical and horizontal portions meet, creating a focused thermal zone that efficiently heats the underlying phase change material. The horizontal portion extends outward to provide broader coverage for programming speed, while the vertical portion provides localized intense heating, achieving both goals without proportionally increasing thermal disturbance.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design effectively minimizes thermal disturbance and improves the reliability of resistive memory cells by adjusting the angle of heater sidewalls and dielectric interfaces, reducing data loss and enhancing memory cell performance.

Implementation Method 1

Programming a phase change memory cell to various resistance states can thermally disturb adjacent phase change memory cells

Methodology Applied
Scientific EffectJoule heating: Joule Heating

Implementation Method 2

enhancing thermal diffusion characteristics by varying the distance and dielectric interfaces

Methodology Applied
Scientific EffectThermal diffusion: Conduction (thermal)

Data Source

PatentUS9343671B2Memory cells having heaters with angled sidewalls
Publication Date: 2016.05.17 MICRON TECHNOLOGY INC
  • US9343671B2 patent drawing
  • US9343671B2 patent drawing
  • US9343671B2 patent drawing

AI summary

Memory cells having heaters with angled sidewalls and methods of forming the same are described herein. As an example, a method of forming an array of resistive memory cells can include forming a first resistive memory cell having a first heater element angled with respect to a vertical plane, forming a second resistive memory cell adjacent to the first resistive memory cell and having a second heater element angled with respect to the vertical plane and toward the first heater, and forming a third resistive memory cell adjacent to the first resistive memory cell and having a third heater element angled with respect to the vertical plane and away from the first heater element.