Antenna Test Fixture Layout for Interference-Free IC Testing

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Solution Overview

Problem

In the manufacturing process of integrated circuits, high-density antenna arrangements in test fixtures lead to interference issues during signal transmission and feedback processes, affecting the accuracy of testing due to close proximity of antennas.

Innovation Solution

The test fixture categorizes antennas into distinct groups based on antenna distance, ensuring distances between antennas in the same group exceed an interference threshold, and utilizes via arrays for shielding to prevent interference, allowing sequential testing while maintaining high-density antenna configurations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If high-density antenna arrangements are used in test fixtures, then the productivity and testing capacity are improved, but antenna interference occurs due to close proximity of antennas

Engineering Contradiction:
Improvetesting capacityVSAvoidantenna interference
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The patent segments the high-density antenna array into multiple groups based on antenna distance criteria. Antennas are categorized into different groups where antennas in the same group are spaced far enough apart to avoid interference, while still maintaining high overall density. This segmentation allows the system to achieve high productivity without suffering from interference issues.

Inventive Principle:
Principle #1Segmentation

2Area of stationary object

If antennas are placed in close proximity to increase density, then the area utilization is improved, but signal transmission accuracy deteriorates due to interference

Engineering Contradiction:
Improvearea utilizationVSAvoidsignal transmission accuracy
Core Design Contradiction:
Area of stationary objectVSMeasurement precision

Solution Approach 1:

The patent applies local quality by creating different spatial zones with different antenna density characteristics. In regions where antennas are placed close together, the system automatically adjusts by grouping them separately and testing them sequentially. This allows high area utilization while maintaining signal transmission accuracy through localized interference management.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent implements periodic action by sequentially testing different groups of antennas rather than testing all antennas simultaneously. The test fixture activates one group at a time, allowing signal transmission accuracy to be maintained while still utilizing high-density antenna arrangements. This periodic activation pattern eliminates interference while preserving area utilization benefits.

Inventive Principle:
Principle #19Periodic action

3Reliability

If sequential testing of antenna groups is implemented, then signal integrity is improved, but the testing time increases

Engineering Contradiction:
Improvesignal integrityVSAvoidtesting time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies preliminary action by pre-categorizing antennas into groups based on their spatial relationships and distance criteria before testing begins. This preliminary segmentation allows the sequential testing process to proceed efficiently without requiring complex real-time decisions, thereby minimizing the time penalty while maintaining signal integrity.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11852672B2Test circuit and method
Publication Date: 2023.12.26 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US11852672B2 patent drawing
  • US11852672B2 patent drawing
  • US11852672B2 patent drawing

AI summary

A method that is disclosed that includes the operations outlined below. Dies are arranged on a test fixture, and each of the dies includes first antennas and at least one via array, wherein the at least one via array is formed between at least two of the first antennas to separate the first antennas. By the first antennas of the dies, test processes are sequentially performed on an under-test device including second antennas that positionally correspond to the first antennas, according to signal transmissions between the first antennas and the second antennas.