Antenna Test Fixture Layout for Interference-Free IC Testing
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Solution Overview
Problem
In the manufacturing process of integrated circuits, high-density antenna arrangements in test fixtures lead to interference issues during signal transmission and feedback processes, affecting the accuracy of testing due to close proximity of antennas.
Innovation Solution
The test fixture categorizes antennas into distinct groups based on antenna distance, ensuring distances between antennas in the same group exceed an interference threshold, and utilizes via arrays for shielding to prevent interference, allowing sequential testing while maintaining high-density antenna configurations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If high-density antenna arrangements are used in test fixtures, then the productivity and testing capacity are improved, but antenna interference occurs due to close proximity of antennas
Solution Approach 1:
The patent segments the high-density antenna array into multiple groups based on antenna distance criteria. Antennas are categorized into different groups where antennas in the same group are spaced far enough apart to avoid interference, while still maintaining high overall density. This segmentation allows the system to achieve high productivity without suffering from interference issues.
2Area of stationary object
If antennas are placed in close proximity to increase density, then the area utilization is improved, but signal transmission accuracy deteriorates due to interference
Solution Approach 1:
The patent applies local quality by creating different spatial zones with different antenna density characteristics. In regions where antennas are placed close together, the system automatically adjusts by grouping them separately and testing them sequentially. This allows high area utilization while maintaining signal transmission accuracy through localized interference management.
Solution Approach 2:
The patent implements periodic action by sequentially testing different groups of antennas rather than testing all antennas simultaneously. The test fixture activates one group at a time, allowing signal transmission accuracy to be maintained while still utilizing high-density antenna arrangements. This periodic activation pattern eliminates interference while preserving area utilization benefits.
3Reliability
If sequential testing of antenna groups is implemented, then signal integrity is improved, but the testing time increases
Solution Approach 1:
The patent applies preliminary action by pre-categorizing antennas into groups based on their spatial relationships and distance criteria before testing begins. This preliminary segmentation allows the sequential testing process to proceed efficiently without requiring complex real-time decisions, thereby minimizing the time penalty while maintaining signal integrity.
Data Source
AI summary
A method that is disclosed that includes the operations outlined below. Dies are arranged on a test fixture, and each of the dies includes first antennas and at least one via array, wherein the at least one via array is formed between at least two of the first antennas to separate the first antennas. By the first antennas of the dies, test processes are sequentially performed on an under-test device including second antennas that positionally correspond to the first antennas, according to signal transmissions between the first antennas and the second antennas.


