Anti-Fuse Readout Circuit With Command-Switched Test Data Path
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Solution Overview
Problem
The authenticity of test results for data stored in anti-fuse programmable devices is poor due to inconsistencies between data paths, leading to inaccurate reflection of data accuracy during testing.
Innovation Solution
An anti-fuse readout circuit with a transmission circuit that latches data from an anti-fuse storage array and transmits it to a data port in response to a read test command, ensuring that the data tested is from the same source as the latch circuit, thereby improving the accuracy of the test results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If data are read out through separate broadcast path and anti-fuse readout path, then data can be transmitted to data port, but test result authenticity deteriorates due to path inconsistencies
Solution Approach 1:
The patent extracts the test mode functionality from the normal readout path by introducing a dedicated test command that activates a specific transmission path. When the test command is detected, the system uses only the anti-fuse readout path to transmit data to the data port, separating the test function from the normal operation path and ensuring authentic test results that reflect actual anti-fuse data accuracy.
Solution Approach 2:
The patent implements dynamic path selection based on the command type. The readout circuit dynamically switches between using the broadcast path combined with anti-fuse readout path for normal operations, and using only the anti-fuse readout path for test operations. This dynamic adjustment ensures that test results authentically reflect the actual data transmission quality through the anti-fuse path.
2Ease of manufacture
If conventional readout circuit is used for testing, then testing can be performed, but test accuracy deteriorates due to data path inconsistencies
Solution Approach 1:
The patent introduces a command detection mechanism as an intermediary that mediates between the readout circuit and the data transmission path. This intermediary detects whether a test command is present and controls the data transmission path accordingly, ensuring that during testing, only data from the anti-fuse readout path is transmitted to the data port, thereby guaranteeing test data accuracy.
3Productivity
If multiple paths are used for data transmission, then data can be read out efficiently, but data consistency deteriorates leading to poor test authenticity
Solution Approach 1:
The patent segments the data transmission function into distinct paths: a normal readout path using broadcast + anti-fuse readout for efficient data access, and a test path using only anti-fuse readout for authentic test data. The command detection mechanism segments the operation modes, ensuring that during testing, only the pure anti-fuse path is used, guaranteeing data consistency and test authenticity while maintaining normal readout efficiency.
Data Source
AI summary
An anti-fuse readout circuit, an anti-fuse memory, and a testing method are provided. The anti-fuse readout circuit includes: a latch circuit configured to latch data read out from an anti-fuse storage array; and a transmission circuit connected to an output terminal of the latch circuit, the transmission circuit being configured to transmit data latched in the latch circuit to a data port in response to a read test command.