Arcuate Soller Slit for High-Resolution In-Plane X-ray Diffraction
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Solution Overview
Problem
Conventional methods for in-plane X-ray diffraction measurements using soller slits result in diffraction images spreading in the in-plane direction due to the X-ray irradiation region covering the sample surface, leading to lower resolution and longer measurement times, especially when using laboratory X-rays.
Innovation Solution
A soller slit with thin plates arranged at a precise angular interval, positioned at the center of a goniometer circle, is used to prevent diffraction image spreading by selecting only X-rays passing through the center, allowing for high-resolution measurements with a short measurement time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional soller slits are used for in-plane X-ray diffraction measurements, then the X-ray irradiation region can cover the sample surface, but the diffraction image spreads in the in-plane direction resulting in lower resolution
Solution Approach 1:
The patent applies curvature by arranging the thin plates of the soller slit in an arcuate configuration that conforms to the goniometer circle. This curved arrangement ensures that only X-rays diffracted at the correct angle pass through the slit, preventing image spreading while maintaining the ability to measure across the sample surface.
Solution Approach 2:
The patent implements local quality by positioning the soller slit at a specific location on the goniometer circle where it can selectively receive diffracted X-rays. The slit's angular interval and positioning create a localized selection of X-ray paths, ensuring high resolution at the detection point while allowing broader sample coverage.
2Productivity
If conventional soller slits are used with X-ray irradiation covering the sample surface, then measurement can be performed, but the measurement time increases
Solution Approach 1:
The arcuate arrangement of thin plates on the goniometer circle enables simultaneous detection of diffracted X-rays from multiple sample regions. This geometric configuration allows the system to capture diffraction information efficiently without requiring sequential scanning, thereby reducing measurement time while maintaining high resolution.
3Measurement precision
If the angular interval between thin plates is narrowed to improve resolution, then the manufacturing precision requirement increases
Solution Approach 1:
By arranging thin plates in an arcuate configuration along the goniometer circle, the patent converts the challenge of maintaining small angular intervals into a geometric solution. The curved arrangement naturally provides the required angular separation while accommodating manufacturing tolerances, as the arc geometry allows for precise positioning without requiring extremely tight angular control between adjacent plates.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The soller slit configuration achieves high-resolution in-plane X-ray diffraction measurements by maintaining a narrow angular interval between plates, ensuring the diffraction image does not spread, thus enabling efficient and precise data collection.
Implementation Method 1
an X-ray diffraction apparatus and a method using the same... When measuring in-plane diffracted X-rays, structure analysis in the laminating direction is possible, as well as the in-plane direction
Implementation Method 2
a plurality of thin plates, each being perpendicular to the bottom surface, which are arcuately arranged with a predetermined angular interval between each other so as to pass X-rays in a radiating direction from a particular focus
Data Source
AI summary
An X-ray diffraction apparatus having a solar slit, and a method for preventing the diffraction image on a detector from spreading in the in-plane direction even when an X-ray irradiation region spreads over the sample surface due to measurement by GIXD, thereby allowing for measurement with a short measurement time and a high resolution. The soller slit 100 includes a plurality of metallic thin plates 110, each being perpendicular to the bottom surface, which are arcuately arranged with a predetermined angular interval between each other so as to pass X-rays in a radiating direction from a particular focus, the soller slit being provided to be used at a position through which X-rays diffracted on a sample surface pass, the particular focus being the center of a goniometer circle, the X-rays being irradiated on a sample at an angle for GIXD.