Material Analysis Using Wave/Particle Radiation TRIZ Cases

A back scattering inspection device moves along a vertical track and rotates to scan multiple surfaces of an inspected object.

A tobacco conveying station uses a movable electromagnetic detector to inspect semi-finished products.

Correlation profiles derived from segmented signal waveforms resolve insufficient signal quantity from lower layers obscured by thin films.

Deflecting electrons to create multiple focal spots along the z-axis reduces cone beam and longitudinal truncation artifacts in computed tomography imaging.

A radiation detector module uses vertical printed circuit boards to connect detection segments in parallel.

Individual beam deflection reduces the Coulomb effect, enabling high-throughput inspection without increasing beam diameter or blurring.

Compensation devices adjust frequency amplitudes to counteract signal distortion in radio-frequency strip conductors.

Variable incidence angles prevent X-ray interference in metal concavities, allowing a two-dimensional detector to capture accurate stress data.

Doped oxides absorb infrared light and transfer energy to the oxide matrix, upconverting it into visible photons to increase solar cell efficiency by 1.8%.

Motor-driven filter wheels and proximity sensors resolve device complexity trade-offs in handheld X-ray fluorescence analyzers, enhancing measurement precision.

A scanning-type X-ray source uses a deflection coil to direct electron beams across multiple anode targets within a vacuum cavity.

A multi-stage X-ray sensor selects detection arrays to enable high-sensitivity inspection within a restricted irradiation region.

An optical inspection system measures peak reflectance orientation differences to detect high angle boundaries, avoiding costly X-ray radiation.

Iterative least squares algorithm removes negative weight templates from overlapping spectra to reduce artefacts and improve measurement precision.

Wavelength ratio analysis at 1660 nm and 1730 nm detects thin-walled PET containers containing liquids, resolving interference issues in recycling sorting.

OSEM-B algorithm reconstructs hybrid CT data to enhance attenuation correction accuracy.

A sensor arrangement measures radiation characteristic variables to determine detector device state.

A method combining X-ray attenuation and NMR susceptibility measurements to calculate a hydrogen to electron ratio for material content inference.

Mirror electron projection apparatus optimizes precharge conditions for semiconductor defect inspection.

Extract magnetization reversal areas from subtraction images to map distortion distribution across wide ranges without surface processing.

An arcuate soller slit prevents in-plane diffraction spreading during GIXD measurements by selecting X-rays passing through the goniometer center.

Raster scanning separates spatial and spectroscopic functions, recovering material composition data without complex multi-pixel fabrication.

Rotating the substrate during fixed-angle milling reduces curtaining defects and redeposition while maintaining consistent surface finish.

Segmented arc emission with varying beam densities balances imaging quality against radiation dose to healthy tissues.

A filter system directs absorber liquid drops into parallel channels to locally attenuate X-radiation.

A silicon nitride window with a reflective coating filters photon interference from heated samples, improving X-ray measurement accuracy.

A proton CT scanner uses a scintillator screen to measure sigma at the exit beam for each pencil beam scanned across an object.

External counteracting vibration generation unit cancels interference sound via 180-degree phase shift, avoiding bulky passive dampening materials.

A control unit measures maximum sample height to dynamically adjust X-ray source and detector positions, preventing collisions with uneven surfaces.

A charge control apparatus adjusts relative movement between electrons and a specimen to achieve uniform charge distribution.

A dual-analyzing system combines x-ray fluorescence and Raman spectroscopy to integrate elemental and molecular data.

A specimen holder uses a thermal drift adjusting unit to stabilize position during temperature changes.

Trigonometric mapping rotates and contracts distorted TKD image points, resolving non-linear diffraction bands for accurate crystal orientation determination.

Replacing mechanical valves with an acoustic field, this design resolves contradictions between measurement precision and device complexity.

Side walls block reflected X-rays that distort detection results, ensuring accurate material composition analysis.

Segmented pixels count X-ray photons in parallel energy bins, resolving sequential charge collection bottlenecks to boost detection speed.

Segmented partially transmissive detector captures backscattered radiation in shadowed regions, eliminating structured noise from direct illumination.

Segmenting tissue into spatial mapping and extraction sections preserves resolution while enabling high-accuracy peptide identification.

High-purity glycerol mixtures mimic hazardous substance properties to validate detection systems without regulatory handling risks.

A galled aluminum joint bonded with a high elongation polymer creates an electrically conductive, gas-tight interface.

Neural network classifies rock images alongside inverted mineral data from an XRF spectrometer on an autonomous vehicle.

A conical shell diffraction detector captures scattered radiation patterns to enable rapid material identification.

An X-ray apparatus uses detachable sensors to automatically switch imaging modes without manual intervention.

Offset multiple x-ray tubes emit overlapping fan beams, reducing cone beam artifacts and stabilizing image reconstruction across the detector array.

A sample holder integrates a porous complex crystal with an information acquisition section for single-crystal X-ray structure analysis.

Medical imaging systems detect physiological motion through sinogram data variations to generate corrected images without external gating devices.

Raster scanning a charged-particle beam over a continuously moving stage eliminates stepping overhead and reduces turnaround times.

A high radiance x-ray source uses a dense electron emitter array to generate focused illumination for semiconductor metrology.

A charged particle beam controller moves an EDS detector to an analysis position based on sample holder type.