X-ray Analyzer Height Adjustment for Uneven Samples
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Solution Overview
Problem
Existing X-ray analyzers face challenges in performing fluorescent X-ray analysis on uneven samples without risking collision between the X-ray source, detector, and the sample, particularly with samples having protrusions or uneven surfaces.
Innovation Solution
An X-ray analyzer system that includes a radiation source, detector, sample stage, moving mechanism, height measuring mechanism, and control unit to adjust distances and positions dynamically based on the sample's maximum height, ensuring the X-ray source and detector are positioned above the sample's maximum height to avoid collisions and optimize analysis performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the X-ray source and detector are brought close to the sample to improve analysis sensitivity, then measurement precision is improved, but the risk of collision with uneven samples increases
Solution Approach 1:
The height measuring mechanism measures the sample height before the X-ray analysis to determine the maximum height in advance. This preliminary measurement allows the control unit to set appropriate distances between the X-ray source/detector and the sample, preventing collision while maintaining optimal analysis sensitivity.
Solution Approach 2:
The system uses feedback from the height measuring mechanism to dynamically adjust the positions of the X-ray source and detector. The control unit receives height information and automatically adjusts distances to maintain optimal analysis conditions while avoiding collision with uneven sample surfaces.
2Measurement precision
If the X-ray source and detector are positioned close to the sample to optimize analysis performance, then analysis quality is improved, but the complexity of position control increases
Solution Approach 1:
The system performs self-adjustment by automatically measuring sample height and controlling the positions of the X-ray source and detector without manual intervention. The control unit integrates the height measurement data and autonomously adjusts distances to optimize analysis quality while simplifying operation.
Solution Approach 2:
The height measuring mechanism and X-ray analysis system are integrated into a unified control framework. The control unit combines height measurement data with X-ray analysis parameters to automatically optimize positioning, reducing the need for separate manual adjustments and simplifying overall system operation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration allows for safe and accurate analysis of uneven samples by preventing collisions and optimizing analysis performance, ensuring correct data acquisition without influencing analysis values due to sample shape irregularities.
Implementation Method 1
an X-ray emitted from an X-ray source is irradiated onto a sample, a fluorescent X-ray which is a characteristic X-ray emitted from the sample is detected
Implementation Method 2
a fluorescent X-ray which is a characteristic X-ray emitted from the sample is detected by an X-ray detector
Implementation Method 3
a fluorescent X-ray which is a characteristic X-ray emitted from the sample and a scattered X-ray are detected
Data Source
AI summary
An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information on the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a sample stage on which the sample is placed, a moving mechanism which moves the sample on the sample stage, the X-ray tube, and the X-ray detector relative to each other, a height measuring mechanism which measures a maximum height of the sample, and a control unit which adjusts the distance between the sample and the X-ray tube and the distance between the sample and the X-ray detector by controlling the moving mechanism on the basis of the measured maximum height of the sample, are included.