Back-Scattering Inspection Device with Movable Track and Rotation
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Solution Overview
Problem
Conventional X-ray back scattering inspection systems have limited inspection range and accuracy due to their fixed scanning mechanisms, which restrict the ability to inspect multiple surfaces of an object effectively.
Innovation Solution
A back scattering inspection system with a movable frame and track arrangement, allowing the inspection device to move along a nonlinear track and rotate, enabling parallel scanning to the inspection channel and adjusting scanning angles to cover multiple surfaces, combined with additional features like laser radar for damage inspection and anti-collision systems for safety.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a fixed scanning mechanism is used, then the device structure is simple, but the inspection range is limited and inspection accuracy is reduced
Solution Approach 1:
The patent applies the dynamics principle by transforming the fixed scanning mechanism into a movable inspection device that can translate along a track and rotate around its movement direction. The back scattering inspection device is no longer stationary but dynamically adjusts its position and orientation to scan multiple surfaces of the inspected object, thereby expanding inspection range and improving accuracy without significantly increasing overall system complexity
Solution Approach 2:
The patent implements dimensionality change by adding movement along a track (one dimension) and rotation around the movement direction (another dimension). This transforms the inspection from a single fixed position to a multi-position, multi-angle scanning capability, allowing the device to cover multiple surfaces of the inspected object and significantly expanding the inspection range
2Device complexity
If a fixed scanning mechanism is used, then the device structure is simple, but the inspection range is limited
Solution Approach 1:
The inspection device is made dynamic by introducing a track for linear movement and a rotation mechanism. The device moves along the track to access different spatial positions and rotates to change scanning angles, thereby expanding the inspection range to cover multiple surfaces of the inspected object while maintaining relatively simple device structure
Solution Approach 2:
The patent adds two degrees of freedom: movement along the track (translational dimension) and rotation around the movement direction (rotational dimension). This dimensional expansion enables the inspection device to cover a much larger area and multiple surfaces of the inspected object without requiring a complex multi-device system
3Measurement precision
If the inspection device moves along a nonlinear track and rotates, then the inspection range and accuracy are enhanced, but the device complexity increases
Solution Approach 1:
The patent segments the inspection function into two independent mechanisms: a first driving device for movement along the track and a second driving device for rotation. This segmentation allows each mechanism to be optimized independently and simplifies the overall control system, reducing the complexity increase that would otherwise result from the combined movement and rotation capabilities
Solution Approach 2:
The inspection device is designed with multi-functionality by integrating both translational movement along the track and rotational capability into a single device. This universal design allows one device to perform multiple inspection functions at different positions and angles, avoiding the need for multiple separate devices and thereby limiting the increase in overall system complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances the inspection range and accuracy by allowing comprehensive scanning of multiple surfaces, preventing collisions, and providing detailed inspection results while ensuring safety and flexibility.
Implementation Method 1
The commonly used X-ray back scattering imaging technology mainly uses a flying spot device to generate spatially changing pen-shaped X-ray beam current to scan an inspected object
Implementation Method 2
The back scattering detector on the same side as a flying spot ray source receives the X-rays scattered by the inspected object
Data Source
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AI summary
The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, wherein a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.