X-ray Inspection Apparatus with Multi-stage Sensor and Dynamic Collimator

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Solution Overview

Problem

Existing X-ray inspection apparatuses face challenges in preventing X-ray leakage, leading to increased size and reduced sensitivity due to the need for wider slits in the collimator, and existing solutions either require larger apparatuses or room for examination adjustments.

Innovation Solution

An X-ray inspection apparatus with a multiple-stage X-ray sensor and a collimator that restricts the X-ray irradiation region, allowing for high-sensitivity inspection without widening the slit, using a designation section to select efficient detection element arrays and a display section to show X-ray detection amounts, and a determination section to automatically set the arrays for inspection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If the slit of the collimator is widened to facilitate positioning, then the ease of operation is improved, but the X-ray leakage increases and the apparatus size must be increased

Engineering Contradiction:
Improvepositioning easeVSAvoidX-ray leakage
Core Design Contradiction:
Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The patent implements temperature-based dynamic adjustment of the collimator and X-ray tube position to compensate for thermal expansion. The control unit automatically adjusts positioning based on temperature sensors, allowing the system to maintain precision without requiring a wider slit for manual adjustment margins.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system uses self-adjusting temperature compensation mechanisms where temperature sensors monitor the X-ray tube and collimator, and the control unit automatically adjusts their positions to compensate for thermal drift, eliminating the need for operator intervention and wider positioning margins.

Inventive Principle:
Principle #25Self-service

2Ease of operation

If the slit of the collimator is widened to facilitate positioning, then the ease of operation is improved, but the apparatus length must be increased to add shield curtains

Engineering Contradiction:
Improvepositioning easeVSAvoidapparatus length
Core Design Contradiction:
Ease of operationVSLength of moving object

Solution Approach 1:

The system dynamically adjusts collimator and X-ray tube positions based on temperature compensation, eliminating the need for static positioning margins. This allows the use of a narrower slit without compromising positioning ease, thereby reducing the apparatus length required for shield curtains.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the operational parameters by implementing temperature-based position adjustment. This allows the system to maintain accurate positioning with a narrower slit, reducing the spatial requirements and apparatus length.

Inventive Principle:
Principle #35Parameter changes

3Object-affected harmful factors

If the slit of the collimator is narrowed to prevent X-ray leakage, then the X-ray leakage is reduced, but the positioning precision becomes more difficult to achieve

Engineering Contradiction:
ImproveX-ray leakageVSAvoidpositioning precision
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

The system implements dynamic temperature compensation that automatically adjusts the positions of the X-ray tube and collimator based on real-time temperature measurements. This allows the use of a narrow slit for reduced leakage while maintaining positioning precision through active compensation.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent employs feedback control where temperature sensors continuously monitor the thermal state of the X-ray tube and collimator, and the control unit adjusts their positions accordingly. This feedback mechanism ensures positioning precision is maintained even with a narrow slit that would otherwise be difficult to position accurately.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables high-sensitivity inspection without enlarging the apparatus by selectively using efficient detection element arrays within the restricted X-ray irradiation region, preventing X-ray leakage and maintaining a compact size.

Implementation Method 1

an X-ray tube generating the X-ray

Methodology Applied
Scientific EffectX-ray generation: X-Ray

Implementation Method 2

an X-ray applied from an X-ray irradiation portion is narrowed by a slit of a collimator

Methodology Applied
Scientific EffectX-ray absorption: Absorption (EM radiation)

Implementation Method 3

an X-ray sensor that has detection element arrays in a plurality of stages... detecting the X-ray

Methodology Applied
Scientific EffectX-ray detection: Photoelectric Effect

Data Source

PatentUS10866331B2X-ray inspection apparatus
Publication Date: 2020.12.15 ANRITSU CORP
  • US10866331B2 patent drawing
  • US10866331B2 patent drawing
  • US10866331B2 patent drawing

AI summary

Provided is an X-ray inspection apparatus that can inspect an object to be inspected with high sensitivity by using a multiple-stage X-ray sensor without widening a slit of a collimator, and can prevent the apparatus from becoming large-sized due to prevention of X-ray leakage. An X-ray inspection apparatus includes an X-ray irradiation portion having an X-ray tube generating an X-ray, an X-ray sensor having detection element arrays in a plurality of stages in a carrying direction, the detection element arrays each formed of a plurality of detection elements linearly arranged in a main scanning direction orthogonal to the carrying direction on a plane parallel to the carrying surface of an object to be inspected, a collimator restricting an X-ray irradiation region for the X-ray sensor, and an imaging condition input section that designates one or more detection element arrays to be used for inspection.