Handheld XRF Analyzer Proximity Sensor and Filter Wheel

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Solution Overview

Problem

Conventional XRF analyzers face limitations due to limited filter choices, Bragg reflection issues, inconvenient device positioning, and lack of communication capabilities, which affect measurement accuracy and versatility.

Innovation Solution

A configurable XRF spectrometer with customizable X-ray flux and detector parameters, a rail mounting system for auxiliary instruments, removable filters, proximity sensors for precise distance measurement, and wireless connectivity for real-time data processing and augmented reality integration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the number of filter choices is increased to improve measurement accuracy for different materials, then the analyzer's versatility is improved, but the device complexity and size increase

Engineering Contradiction:
Improvefilter choicesVSAvoidanalyzer size
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent implements a motor-driven filter wheel that can dynamically rotate to position different filters in the X-ray beam path. This dynamic mechanism allows multiple filter choices (Al, Cu, Zn, Pb, etc.) to be accommodated in a compact space, resolving the contradiction between versatility and device size by making the filter selection system movable rather than static.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The filter wheel assembly adds a rotational dimension to the filter selection process. Instead of arranging filters in a linear sequence that would increase device length, the circular filter wheel arrangement allows multiple filters to be positioned around a rotation axis, effectively utilizing three-dimensional space to accommodate multiple filter options without proportionally increasing the overall device footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If Bragg reflection is filtered out to improve measurement accuracy, then the quantification accuracy is improved, but the device complexity increases due to additional filtering requirements

Engineering Contradiction:
Improvequantification accuracyVSAvoidfiltering system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies the local quality principle by selecting specific filters (particularly Al and Cu filters) that are optimized for filtering Bragg reflection at particular energy ranges. Rather than using a complex universal filtering system, the invention uses material-specific filter properties to address Bragg reflection locally at the points where it most affects measurement accuracy, thereby improving quantification without excessive complexity.

Inventive Principle:
Principle #3Local quality

3Ease of operation

If auxiliary devices are integrated onto the XRF analyzer to improve operational convenience, then the ease of operation is improved, but the device complexity increases

Engineering Contradiction:
Improvedevice positioningVSAvoidintegrated components
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The patent merges multiple auxiliary functions into the single XRF analyzer body: a proximity sensor is integrated to automatically measure and display the distance between the analyzer and sample, and a rail mounting system is incorporated to attach additional auxiliary devices. This consolidation allows operators to benefit from multiple enhanced functions without managing separate standalone devices, improving ease of operation while containing complexity within a unified system.

Inventive Principle:
Principle #5Merging (Combining)

4Measurement precision

If the proximity sensor is added to measure distance continuously to improve measurement accuracy, then the measurement precision is improved, but the device complexity increases

Engineering Contradiction:
Improvedistance measurementVSAvoidsensor system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The proximity sensor operates autonomously to continuously measure and display the distance between the analyzer and sample without requiring manual intervention. The sensor self-calibrates and provides real-time feedback, automatically compensating for distance variations during measurement. This self-service capability improves measurement precision while minimizing the operational complexity burden on the user.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances measurement accuracy by reducing Bragg reflections, improves filter customization, and enables real-time data processing and remote analysis, increasing the analyzer's versatility and precision in detecting elemental compositions.

Implementation Method 1

A radiation source assembly including a first centerline axis is configured to direct an X-ray beam to impinge on a sample to be tested. A radiation detector assembly including a second centerline axis is configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam.

Methodology Applied
Scientific EffectX-ray fluorescence: Fluorescence

Implementation Method 2

A proximity sensor is configured to continuously measure a distance between the XRF analyzer and the sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property.

Methodology Applied
Scientific EffectProximity sensing:

Data Source

PatentUS10641718B2X-ray fluorescence analyzer
Publication Date: 2020.05.05 BRUKER AXS LLC
  • US10641718B2 patent drawing
  • US10641718B2 patent drawing
  • US10641718B2 patent drawing

AI summary

A system and method for processing X-ray fluorescence data in a hand-held X-ray Fluorescence (XRF) analyzer are provided. The X-ray fluorescence (XRF) analyzer includes a radiation source assembly including a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested. The XRF analyzer also includes a radiation detector assembly including a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam. The XRF analyzer further includes a processor configured to determine a property of the sample to be tested from the emitted XRF, and a proximity sensor configured to continuously measure a distance between the XRF analyzer and the sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property.