Aromatic Divinyl Ether Molding Composition for Residual Layer-Free Imprint Lithography

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Solution Overview

Problem

Current step and flash imprint lithography (SFIL) processes face challenges in producing nanoscale features with high aspect ratios due to residual layer issues, which affect the quality of the imprint mask, and are sensitive to oxygen, have low curing rates, high volatility, high viscosity, and low tensile strength.

Innovation Solution

Aromatic divinyl ethers are used in combination with a photoacid generator and stabilizing/sensitizing agents to form a molding composition that, when exposed to actinic radiation, creates a cured layer with thick and thin regions, allowing for the removal of the residual layer without damaging the imprinted features, and a backfill material is used to expose substrate regions for trench formation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If a low-viscosity photosensitive molding material is used in SFIL, then the material can be easily molded between template and substrate, but a residual layer remains that must be removed which damages the imprinted features

Engineering Contradiction:
ImprovemoldabilityVSAvoidfeature integrity
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The patent changes the chemical composition parameters of the molding material by incorporating specific additives and crosslinking agents that modify the curing behavior. This allows the material to be easily molded in low-viscosity state while achieving complete or near-complete curing that eliminates the residual layer, thus resolving the contradiction between ease of molding and feature integrity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent uses composite molding materials comprising multiple components including photoinitiators, crosslinking agents, and additives work together. This composite formulation enables the material to exhibit both easy moldability and complete curing characteristics, eliminating the need for residual layer removal while preserving imprinted feature integrity

Inventive Principle:
Principle #40Composite materials

2Ease of manufacture

If current SFIL-R formulations are used, then the process can be implemented, but the formulations have low curing rates, high volatility, high viscosity, and low tensile strength which adversely affect quality

Engineering Contradiction:
Improveprocess implementabilityVSAvoidimprint mask quality
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent optimizes multiple parameters of the SFIL-R formulation simultaneously: adjusting molecular weight distribution to reduce viscosity, selecting photoinitiators for high curing rates, incorporating volatility reducers, and adding tensile strength enhancers. These parameter changes collectively improve all four deficient properties while maintaining process implementability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs a composite formulation strategy where multiple chemical components work synergistically: photoinitiators for rapid curing, crosslinking agents for high tensile strength, volatility reducers to suppress evaporation, and viscosity modifiers. This composite approach resolves all four quality issues simultaneously while preserving the ease of manufacture

Inventive Principle:
Principle #40Composite materials

3Manufacturing precision

If the residual layer is removed to transfer the imprinted pattern, then the pattern transfer can be achieved, but the shape and size of imprinted features are altered or damaged

Engineering Contradiction:
Improvepattern transfer accuracyVSAvoidfeature geometry
Core Design Contradiction:
Manufacturing precisionVSShape

Solution Approach 1:

The patent extracts or eliminates the harmful residual layer through complete curing of the molding material. By ensuring full polymerization and crosslinking, the residual layer is converted into a stable, removable structure that can be cleanly removed via oxygen plasma or other selective removal techniques without affecting the cured imprinted features, thus achieving accurate pattern transfer while preserving feature geometry

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent performs preliminary complete curing of the molding material before the removal step. This preliminary action ensures that the imprinted features are fully formed and stabilized with correct shape and size, so that subsequent removal of uncured material does not alter the feature geometry, enabling accurate pattern transfer

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in SFIL-R formulations and processes that are less sensitive to oxygen, have high curing rates, low volatility, low viscosity, and high tensile strength, enabling the creation of high-quality nanoscale features without the need for residual layer removal, thus improving the quality of the imprint mask.

Implementation Method 1

Aromatic divinyl ethers are used in combination with a photoacid generator and stabilizing/sensitizing agents to form a molding composition that, when exposed to actinic radiation, creates a cured layer

Methodology Applied
Scientific EffectPhotopolymerisation: Photopolymerisation

Data Source

PatentUS8759415B2Aromatic vinyl ether based reverse-tone step and flash imprint lithography
Publication Date: 2014.06.24 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US8759415B2 patent drawing
  • US8759415B2 patent drawing
  • US8759415B2 patent drawing

AI summary

A molding composition and a method of forming a pattern. The method includes forming on a substrate a molding layer of a molding composition of aromatic divinyl ethers; pressing the template into the molding layer, the template having a relief pattern, the molding layer filling voids in the relief pattern, the template not contacting the substrate; exposing the molding layer to actinic radiation, the actinic radiation converting the molding layer to a cured molding layer having thick and thin regions corresponding to the relief pattern; removing the template; filling the thin regions of the relief pattern with a backfill material; removing regions of the molding layer not protected by the backfill material to expose regions of the substrate; forming trenches in the exposed regions of the substrate; and removing any remaining molding layer and backfill material. A transfer layer may be used between the molding layer and the substrate.