Array Substrate Testing Device Synchronous Parallel Operation
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Solution Overview
Problem
The existing testing method for array substrates is inefficient due to the need for a single tester to perform both electrical stress and power-on tests sequentially at each testing position, resulting in prolonged testing time and underutilization of testers.
Innovation Solution
A testing device with at least two sets of testers that operate synchronously, where one set performs the electrical stress test and the other set performs the power-on test, allowing for simultaneous testing and reducing overall testing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a single tester performs both electrical stress test and power-on test sequentially at each testing position, then the testing process is simple to operate, but the testing time is prolonged and testing efficiency is low
Solution Approach 1:
The patent divides the testing process into two separate testing actions: electrical stress testing and power-on testing. Multiple testers are allocated to perform different testing tasks simultaneously at different testing positions. This segmentation allows parallel execution of testing operations, thereby improving testing efficiency while maintaining operational simplicity through standardized testing procedures.
Solution Approach 2:
The patent combines multiple testers working in parallel to achieve simultaneous testing at multiple positions. By merging the capabilities of multiple testers and coordinating their operations through a control system, the system achieves high-efficiency parallel testing while maintaining centralized control for operational simplicity.
2Device complexity
If a single tester performs both electrical stress test and power-on test sequentially, then the device configuration is simple, but the testing time increases and efficiency decreases
Solution Approach 1:
The patent segments the testing functions across multiple testers, with each tester dedicated to specific testing tasks. This functional segmentation enables simultaneous execution of electrical stress tests and power-on tests at different positions, significantly reducing total testing time while keeping each individual tester's configuration relatively simple.
Solution Approach 2:
The patent implements preliminary positioning and configuration of multiple testers at different testing positions before actual testing begins. This preliminary setup includes pre-configuring testing parameters and establishing testing sequences, which allows the system to execute parallel testing efficiently without complex real-time decision-making, thus reducing testing time while maintaining manageable system complexity.
3Productivity
If multiple testers operate synchronously with different testing actions, then testing efficiency is improved, but the coordination and control complexity increases
Solution Approach 1:
The patent implements dynamic coordination of multiple testers through a control system that can adjust testing sequences and parameters in real-time. The system dynamically allocates testing tasks to different testers based on their operational status and testing progress, enabling efficient parallel testing while adapting to changing conditions. This dynamic control approach improves testing efficiency while managing coordination complexity through flexible, rule-based control logic.
Data Source
AI summary
The present application discloses a testing device of array substrates and a testing method. The testing device of array substrates includes: a machine and testing interfaces, the testing interfaces being disposed on the machine; and testers disposed above the machine. There are at least two sets of testers, and the testers synchronously operate according to a preset scheme.