Area Scanning Confocal Microscopy Tilted Focal Plane
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Solution Overview
Problem
Conventional confocal microscopy systems face limitations in measurement speed due to the need for mechanical scanning in multiple directions, and they are unable to perform direct area scanning effectively, leading to crosstalk and reduced depth discerning capability.
Innovation Solution
The implementation of an area scanning confocal microscope with a tilted focal plane or field, where a highly tilted illumination and imaging field are combined, allowing each line of the illumination pattern to be projected at a different height along the optical axis, enabling direct area confocal measurement and significantly increasing measurement speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If conventional confocal systems use mechanical scanning in x-y and z directions, then measurement precision and depth discerning capability are maintained, but measurement speed is slow
Solution Approach 1:
The patent divides the 3D measurement space into multiple 2D planes that can be scanned simultaneously using parallel light sheets. By segmenting the volumetric scan into multiple planar scans that occur at different depths but are captured in parallel, the system achieves faster measurement speed while maintaining measurement precision through the confocal condition at each plane.
Solution Approach 2:
The patent transitions from sequential 1D/2D mechanical scanning to a 3D parallel scanning approach by introducing the depth dimension as an additional scanning parameter rather than a sequential step. Multiple planes at different z-positions are illuminated and detected simultaneously, effectively adding a dimensional layer to the scanning process that increases speed without sacrificing precision.
2Speed
If direct area scanning is performed without tilted focal plane, then measurement speed increases, but crosstalk between measurement points increases and depth discerning capability is lost
Solution Approach 1:
The patent introduces an asymmetric tilted focal plane configuration where the illumination and detection paths are deliberately angled relative to each other. This asymmetric arrangement creates a geometric relationship that separates in-focus light from out-of-focus light, enabling depth discrimination in direct area scanning mode without requiring sequential mechanical scanning.
Solution Approach 2:
The patent changes the focal plane orientation parameter from parallel to tilted relative to the detection plane. This parameter change transforms the optical geometry such that only light from the tilted focal plane satisfies the confocal condition, thereby eliminating crosstalk and preserving depth discerning capability while enabling direct area scanning.
3Productivity
If point array or slit scanning is used to generate confocal conditions, then measurement speed is improved, but complete 2D area coverage with dense points is not achieved
Solution Approach 1:
The patent merges the advantages of point array scanning (parallel processing) with area scanning (complete coverage) by using tilted focal plane geometry. This combination allows every lateral location in the 2D area to satisfy the confocal condition simultaneously while maintaining dense point coverage, achieving both high productivity and complete area measurement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables fast 3D microscopic measurements, with the proposed method being more than 300 times faster than conventional array scanning modes, while maintaining depth discerning capability, although it may sacrifice some resolution and measurement area.
Implementation Method 1
a projection unit comprising a microscope objective configured to project the line illumination pattern onto an object through the microscope objective, wherein the focal plane in which the line illumination pattern is projected or imaged is tilted at a tilting angle with respect to an optical axis of the microscope
Implementation Method 2
confocal microscopy has become one of the most important technologies for 3D measurement. Due to its noninvasive property and unique depth discerning capability
Data Source
Figure 1A~1C
Figure 2A~2B
Figure 3A~3B
AI summary
The present invention relates to an area scanning confocal microscope and a method for performing area scanning confocal measurement of an object using a confocal microscope. The area scanning confocal microscope comprises: a pattern generation unit configured to generate or produce a line pattern comprising a plurality of lines, for example a plurality of straight parallel lines; a projection unit comprising a microscope objective configured to project the line pattern onto an object through the microscope objective, wherein the focal plane in which the line pattern is projected or imaged is tilted at a tilting angle with respect to an optical axis of the microscope, the tilting angle being equal to or greater than 0° and smaller than 90°, for example between 30° and smaller than 85°; and an imaging unit comprising a two-dimensional image detector configured to capture within one image frame of the image detector an image of the projected line pattern.