Asynchronous Voltage Margin Testing for IC Reliability
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Solution Overview
Problem
Conventional integrated circuit reliability testing methods require multiple test corners, long test times, and high power consumption, leading to elevated temperatures, which are inefficient and undesirable.
Innovation Solution
A method involving the selection of non-normal operating conditions for clock frequency, temperature, and power supply voltage, combined with an asynchronously time varying power supply voltage, a continuous test pattern, and monitoring for failures, to efficiently test integrated circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional reliability testing methods are used with multiple test corners, then comprehensive coverage is achieved, but test time increases significantly
Solution Approach 1:
The patent applies dynamics by transitioning from static, discrete test corners to a dynamic, continuous stress approach. The asynchronous time-varying power supply voltage continuously modulates the operating conditions, dynamically exploring the entire parameter space between minimum and maximum voltage levels rather than testing fixed corners, thereby achieving comprehensive coverage more efficiently
Solution Approach 2:
The patent employs periodic action through the asynchronous time-varying power supply voltage that continuously cycles between minimum and maximum levels. This periodic stress pattern repeatedly subjects the circuit to extreme conditions, enabling comprehensive reliability testing to occur over a condensed time period compared to conventional methods
2Reliability
If conventional reliability testing methods are used with multiple test corners, then comprehensive coverage is achieved, but power consumption increases leading to higher temperatures
Solution Approach 1:
The asynchronous time-varying power supply voltage applies periodic stress cycles that alternate between high and low voltage states. This periodic action distributes the thermal load over time rather than sustaining maximum power consumption continuously, thereby achieving comprehensive reliability testing coverage while controlling overall temperature rise
Solution Approach 2:
The continuous application of time-varying voltage stress ensures that the circuit is constantly subjected to reliability testing conditions without interruption. This continuous useful action maintains comprehensive coverage while the varying voltage profile prevents sustained maximum power dissipation, thereby controlling temperature
3Ease of manufacture
If conventional reliability testing methods are used, then standard testing procedures are followed, but test efficiency decreases
Solution Approach 1:
The patent substitutes the mechanical approach of physically reconfiguring test equipment for multiple test corners with an electronic solution. The asynchronous time-varying power supply voltage electronically generates continuous stress patterns, replacing the need for multiple discrete test setups and procedures, thereby dramatically improving test efficiency while maintaining comprehensive coverage
Data Source
AI summary
Method and apparatus for margin testing integrated circuits. The method includes selecting a clock frequency, an operating temperature range and a power supply voltage level for margin testing an integrated circuit wherein one or more of the clock frequency, the operating temperature range and the power supply voltage level is outside of the normal operating conditions of the integrated circuit; applying an asynchronously time varying power supply voltage set to the selected power supply voltage level to the integrated circuit; running the integrated circuit chip at the selected clock frequency and maintaining the integrated circuit within the selected temperature range; applying a continuous test pattern to the integrated circuit; and monitoring the integrated circuit for fails.