Marginal Circuit Testing TRIZ Cases
- BIST Leakage Detection Circuit for IC I/O Soft Failures
A serial resistor-transistor BIST detects sub-microamp leakage at IC I/O terminals, exposing soft PID and ESD failures with stable sensitivity.
- Chip Characterization via Boundary Voltage Oscillator Measurement
By sweeping voltage to the failure boundary and recording oscillator signals, this case enables non-destructive chip reliability measurement.