Semiconductor Device Leakage Cut-Off Circuit for Defect Analysis
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Solution Overview
Problem
Current semiconductor devices face challenges in efficiently analyzing defects related to the leakage cut-off function, particularly in identifying defective circuit blocks due to increased power consumption and time-consuming defect analysis processes when operating at low threshold voltages for high-speed performance.
Innovation Solution
A semiconductor device with a setting circuit and switch control circuit that dynamically control the state of switch circuits between valid and invalid states based on operation modes, allowing for efficient defect analysis by reducing off-state leakage current and enabling high-speed operation with low power consumption, and incorporating test mode and storage circuits to pinpoint defect locations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If the threshold voltage of the transistor is lowered to enable high-speed operation with low power supply voltage, then the operating speed of the semiconductor device is improved, but the off-state leakage current increases causing higher power consumption in standby period
Solution Approach 1:
The semiconductor device is divided into multiple circuit blocks (first circuit block, second circuit block, etc.), each with its own switch transistor. This segmentation allows independent control of leakage current in each block, enabling selective power-off of inactive blocks while maintaining operation in active blocks, thus resolving the contradiction between high-speed operation and low standby power consumption.
Solution Approach 2:
The switch transistors are dynamically controlled based on the operation state of each circuit block. When a circuit block is in standby state, its corresponding switch transistor turns off to block leakage current. This dynamic adjustment allows the device to maintain low threshold voltage for high-speed operation while minimizing standby power consumption through adaptive leakage current management.
2Use of energy by moving object
If a switch transistor is added to each circuit block to reduce off-state leakage current, then power consumption in standby period is reduced, but the device complexity increases
Solution Approach 1:
The switch transistors serve multiple functions: they act as leakage cut-off transistors to block off-state leakage current, and simultaneously serve as control elements for dynamic power management. This multi-functionality reduces the need for additional dedicated leakage blocking structures, thereby limiting the increase in device complexity while achieving significant power consumption reduction in standby period.
3Ease of manufacture
If function test is performed in normal mode with leakage cut-off function valid, then the test process is simplified, but defect analysis efficiency is reduced when leakage cut-off related defects occur
Solution Approach 1:
The patent implements a preliminary action by setting the leakage cut-off function to invalid state specifically during defect analysis testing. This preliminary configuration allows the test to directly reveal leakage cut-off related defects without the interference of the active leakage cut-off function, enabling efficient defect analysis while maintaining test process simplicity for normal operation verification.
Data Source
AI summary
A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal of a corresponding circuit block and a power supply line. A setting circuit is disposed to set each of the plurality of switch circuits to be in a valid or invalid state. A switch control circuit turns on each of the plurality of switch circuits according to a first control signal for indicating an operation state of the plurality of circuit blocks when each of the plurality of switch circuits is set in a valid state by the setting circuit and turns on each of the plurality of switch circuits regardless of the first control signal when each of the plurality of switch circuits is set in an invalid state by the setting circuit.