On-Chip Voltage Regulator Self-Test for IC Characterization
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Solution Overview
Problem
Existing integrated circuits lack effective methods for analyzing on-chip controlled integrated circuits, particularly in determining valid operating characteristics and identifying outliers, especially when powered by a single voltage supply with on-chip regulators.
Innovation Solution
A test apparatus is used to contact and power the integrated circuit, controlling the on-chip regulator to adjust output and initiate self-tests at various voltages, allowing iterative analysis of operating capabilities and identifying outliers by comparing results with surrounding circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Use of energy by moving object
If a single voltage supply is provided to the die with on-chip regulators, then power consumption is reduced and battery life is extended, but the complexity of analyzing and testing the integrated circuit increases
Solution Approach 1:
The integrated circuit performs self-testing through on-chip self-test processes that automatically execute when powered by the on-chip regulator at different voltage levels. The circuit tests itself without requiring external test equipment, thereby simplifying the testing process despite the added complexity of on-chip regulation.
Solution Approach 2:
The test apparatus controls the on-chip regulator to output different desired voltages and receives test results from self-test processes, creating a feedback loop that enables iterative analysis of operating characteristics. This systematic feedback mechanism simplifies characterization by automatically collecting data across multiple operating points.
2Adaptability or versatility
If on-chip regulators are used to control power output, then multiple supply voltages can be created from a single input, but the difficulty of detecting and measuring operating characteristics increases
Solution Approach 1:
The test apparatus pre-configures the on-chip regulator to output specific desired voltages before initiating self-test processes. This preliminary setup ensures that the circuit is properly conditioned for testing at each operating point, making measurement easier by establishing known test states in advance.
Solution Approach 2:
The on-chip regulator serves multiple functions: it powers the circuit during normal operation and simultaneously serves as a test stimulus source during self-testing. This multi-functionality simplifies measurement by using the same component for both operation and characterization, eliminating the need for separate test power supplies.
3Measurement precision
If iterative self-test processes are performed at various regulator output levels, then operating capabilities are thoroughly analyzed, but the time required for testing increases
Solution Approach 1:
The testing is performed iteratively at discrete voltage levels rather than continuously, with the on-chip regulator stepping through predetermined output values. This periodic sampling approach provides sufficient characterization accuracy while limiting the total testing time by not requiring exhaustive measurement at every possible operating point.
Data Source
AI summary
Methods and apparatus for analyzing an integrated circuit are disclosed. An example method includes supplying power to an on-chip supply power regulator of integrated circuit, instructing the on-chip supply power regulator to output a circuit supply signal having a desired minimum voltage level for the integrated circuit, instructing the integrated circuit to initiate an on-chip self-test process, analyzing the results of the on-chip self-test process, and repeating the process after stepping down the voltage of the circuit supply signal level.