Atom Chip Accelerometer Bias Correction via Dual-Sensor Inversion

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Solution Overview

Problem

Existing inertial sensors using cold atom interferometry on atom chips face challenges in eliminating measurement bias and errors, which affect the accuracy and reliability of inertial parameter measurements.

Innovation Solution

The development of an accelerometer-type inertial sensor and a measurement method that utilizes two elementary sensors on the same atom chip, configured to eliminate measurement bias by taking dual simultaneous measurements with opposite phase signs, allowing for the correction of additive bias.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a single cold atom interferometer is used to measure acceleration, then the device is compact and simple, but measurement bias and errors cannot be eliminated

Engineering Contradiction:
Improveacceleration measurement accuracyVSAvoidsensor configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention divides a single interferometer into two independent elementary sensors (SENA and SENB) that operate simultaneously on the same atom chip. Each sensor performs its own interferometric sequence with atoms separated into two clouds, allowing independent measurements that can be combined to eliminate bias through differential processing

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention merges two elementary sensors onto a single atom chip platform, sharing common infrastructure (vacuum chamber, atom generation device, waveguides, conductive elements) while maintaining independent measurement capabilities. This combination enables bias cancellation through simultaneous dual measurements without proportionally increasing overall system complexity

Inventive Principle:
Principle #5Merging (Combining)

2Reliability

If two elementary sensors are used simultaneously, then measurement bias can be eliminated, but the device complexity increases

Engineering Contradiction:
Improvemeasurement reliabilityVSAvoidsensor configuration
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The invention creates a copy of the elementary sensor configuration (SENB as a copy of SENA) with inverted trajectory directions. This copying approach allows identical measurement sequences to be performed simultaneously with opposite phase signs, enabling mathematical elimination of additive bias through subtraction of the two measurements while maintaining identical hardware configurations

Inventive Principle:
Principle #26Copying

3Measurement precision

If atoms are spatially separated into two clouds with opposite trajectories, then bias correction is enabled, but the measurement process becomes more complex

Engineering Contradiction:
Improveacceleration measurement precisionVSAvoidinterferometer sequence complexity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The invention inverts the trajectory directions between the two elementary sensors: SENA separates atoms along trajectories in one direction while SENB separates atoms along parallel trajectories in the opposite direction. This inversion creates opposite phase signs in the interferometric measurements, allowing additive bias to be eliminated through simple subtraction of the two phase measurements

Inventive Principle:
Principle #13The other way round (Inversion)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach improves the sensitivity and accuracy of inertial measurements by reducing measurement uncertainty, enabling longer inertial navigation times and more reliable data.

Implementation Method 1

using microwave fields for spatially separating two clouds of atoms according to two internal states

Methodology Applied
Scientific EffectMicrowave field interaction with atomic states: Electromagnetic Induction

Implementation Method 2

The operation of the cold atom accelerometer is based on interferometry, and measuring the phase difference of the interferometer can be used to derive an acceleration measurement

Methodology Applied
Scientific EffectInterferometry: Interference

Implementation Method 3

A Ramsey-type interferometer sequence measures a phase φ that is accumulated when implementing the sequence

Methodology Applied
Scientific EffectRamsey interferometry: Interference

Implementation Method 4

The magnetic trap is moved along the trajectories by conductive wires/elements and microwave guides disposed on and in the atom chip

Methodology Applied
Scientific EffectMagnetic trapping: Magnetic Field

Data Source

PatentUS20250044091A1Accelerometer-type bias correction ultracold atom sensor
Publication Date: 2025.02.06 THALES SA
  • US20250044091A1 patent drawing
  • US20250044091A1 patent drawing
  • US20250044091A1 patent drawing

AI summary

An accelerometer-type interferometric ultracold atom inertial sensor including an atom chip including at least one set of a first and a second elementary sensor; an atom generation device; a generator for generating a uniform magnetic field; a power supply device; with the arrangement of the group of one or more conductive elements of each sensor and the sequence being further configured so that the trajectories associated with the first elementary sensor and the trajectories associated with the second elementary sensor are parallel to each other, are of the same length, are covered simultaneously and so that the departure direction of the first clouds, from the first and the second elementary sensor respectively, are opposite; the sensor further comprising a detection system.