Automated Probe Positioning for Liquid Microjunction Sampling
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Solution Overview
Problem
Existing sampling techniques for surface array spots require manual operator intervention to maintain the optimal probe-to-surface array distance, leading to precision that depends on the operator's skill, especially when collecting multiple samples from different spots or development lanes.
Innovation Solution
A sampling system that includes a sampling probe with image analysis capabilities to automatically adjust the distance between the probe tip and the surface array by capturing images and comparing them to a target distance, allowing for real-time optimization of the liquid microjunction thickness during the sampling process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual operator control is used to adjust probe-to-surface array distance, then the system structure remains simple, but the precision and consistency of sampling depend on operator skill
Solution Approach 1:
The system uses an image capture device and processor to automatically measure and adjust the probe-to-surface array distance without operator intervention. The processor compares captured images against reference images and controls the positioning system to maintain optimal spacing, enabling the system to self-regulate the critical parameter
Solution Approach 2:
The manual mechanical adjustment by operator is replaced with an automated optical measurement system (image capture device) and electronic control system (processor). The visual feedback loop substitutes human judgment with automated image processing algorithms that objectively determine optimal probe positioning
2Productivity
If manual adjustment is used for collecting multiple samples from different spots, then the device complexity remains low, but the time required for sample collection increases due to repeated manual adjustments
Solution Approach 1:
The automated positioning system maintains continuous monitoring and adjustment of the probe-to-surface array distance throughout the entire sampling process. As the probe moves between different sample spots, the system continuously captures images and adjusts positioning to ensure optimal spacing is maintained at all times, eliminating idle adjustment time between samples
Solution Approach 2:
The system implements a closed-loop feedback mechanism where the image capture device continuously monitors probe positioning, the processor analyzes the images to determine actual spacing, and the positioning system automatically adjusts to correct any deviations from optimal spacing, creating a self-correcting system that maintains precision throughout continuous operation
Data Source
Figure 1
Figure 2~6b
Figure 3a~3b
AI summary
A system (20) and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid micro junction used to sample solution composition from the surface and for re-optimization, as necessary, of the micro junction thickness during a surface scan to achieve a fully automated surface sampling system.