Backplane Failure Simulation Using BSCAN Infrastructure
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Solution Overview
Problem
Current failure simulation methods in system environments require additional control lines and dedicated control circuit packs, limiting the ability to test fully equipped shelves and forcing new control lines that are not customer-relevant, and are not feasible for existing backplanes.
Innovation Solution
The implementation of an I/O circuit pack with an interface circuit for communication between a backplane boundary scan bus and a local BSCAN chain, utilizing existing test infrastructure to simulate fault conditions by setting a fault simulation device to an active state and bypassing other devices, allowing for comprehensive testing without additional hardware.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate control lines and control circuit packs are used for failure simulation, then failure detection capability is improved, but device complexity and cost increase
Solution Approach 1:
The BSCAN bus and boundary scan devices are designed to serve dual purposes: normal system operation and failure simulation/testing. The existing BSCAN infrastructure, originally intended for boundary scan testing, is made universally applicable to both operational functions and diagnostic functions, eliminating the need for separate dedicated control lines and circuit packs.
Solution Approach 2:
The system uses its own existing BSCAN test infrastructure to perform failure simulation without requiring external dedicated control mechanisms. The boundary scan devices within the system itself provide the capability to simulate and detect failures, making the system self-sufficient for both operation and testing.
2Adaptability or versatility
If dedicated control circuit packs are used for failure simulation, then failure simulation capability is improved, but productivity and time-to-market worsen due to additional hardware requirements
Solution Approach 1:
The BSCAN infrastructure is designed to perform multiple functions including normal system operation, boundary scan testing, and failure simulation. This multi-functionality eliminates the need for separate dedicated control circuit packs, reducing hardware complexity and accelerating time-to-market.
Solution Approach 2:
The failure simulation capability is extracted from the concept of dedicated control circuit packs and integrated into the existing BSCAN boundary scan devices. This extraction eliminates the need for separate hardware components while maintaining full failure simulation capability.
3Reliability
If additional control lines are added to the backplane for failure simulation, then failure detection capability is improved, but ease of manufacture and adaptability worsen due to backplane redesign requirements
Solution Approach 1:
The existing BSCAN bus lines in the backplane are made multi-functional to serve both normal system communication and failure simulation purposes. This eliminates the need to add separate dedicated control lines to the backplane, maintaining ease of manufacture and backward compatibility.
Solution Approach 2:
The failure simulation control signals are merged with the existing BSCAN bus infrastructure rather than being separated into dedicated control lines. This consolidation allows the same physical infrastructure to handle both operational and diagnostic functions, avoiding backplane redesign.
Data Source
AI summary
A method and apparatus for reducing cost for the backplane and system test and for speeding up the time to market of a new product are disclosed. A failure simulation based on system level Boundary Scan architecture allows the use of an already available test infrastructure for test and validation.