Electronic Circuit Testing TRIZ Cases
- Semiconductor Chip Test Device With Cushioning Member
A semiconductor chip test device uses a cushioning member to absorb impact forces during performance testing.
- Thermally Insulated Test Recess for Electronic Component Temperature Testing
Segmenting the testing chamber from the main machinery reduces energy consumption and mechanical stress on handling systems during extreme temperature cycles.
- Segmented Vertical Probe Head for High Pin Count Alignment
A combined probe head segments layout areas using sub-dies to maintain accurate alignment during assembly.
- Iterative Leakage Screening for Electrolytic Capacitor Reliability
Iterative leakage current screening removes unstable electrolytic capacitors before burn-in to ensure low failure rates.
- Traction Battery Connection Simulator for Controller Testing
A traction battery connection simulator uses controlled power supply sequencing to test vehicle controller components.
- Backplane Failure Simulation Using BSCAN Infrastructure
Interface circuit links backplane boundary scan bus to local chains, enabling full-shelf testing without additional control lines.
- Insertion Extraction Mechanism for Semiconductor Block Member Replacement
A housing integrates multiple engaging pins to simultaneously lock onto block member portions, reducing replacement time and preventing terminal contamination.
- Kelvin Force and Sense Contacts for Microcircuit Testing
Laterally arranged sense contacts surround compressible force contacts to establish precise electrical connections.
- Display Device Inspection Wiring Reducing Frame Area
Extending second inspection wiring into the display region reduces frame area, improving aperture ratio and enabling efficient wiring defect detection.
- Crankshaft Sensor Inverted Connection Detection
Calculates tooth time ratios against thresholds to detect inverted crankshaft sensor wiring, preventing angular position errors.
- Semiconductor Package Adsorption Pad Silicon Oil Stiction Prevention
Segmented adsorption pad traps eluted silicon oil via non-stick polyimide layer, preventing package sticking during vacuum testing.
- Probe Card Composite Body for Multi-Temperature Alignment
A probe card composite body bonds a heat expansion adjusting member to the probe base plate.
- Circuit Breaker Arc Fault Detection Using Acoustic and Current Signals
Dual acoustic sensors and a current sensor distinguish parallel from series arc faults, reducing false alarms from electrical loads.
- Zigzag Probe Position Monitoring Structure for IC Testing
A zigzag probe position monitoring structure measures electrical resistance to verify test probe alignment during integrated circuit manufacturing.
- Elastic Variable Holder for Flexible Electrode Elongation Testing
An elongation tester uses an elastic variable holder to accommodate material deformation during testing.
- Semiconductor Integrated Circuit Scan Chain Loop Operation
A semiconductor integrated circuit uses multiplexer-configured closed loops in scan chains to circulate test data before shift operations.
- Serial Scan Test Data Delivery Circuit Reducing Tester Resources
A design-for-test circuit deserializes serial data to stimulate integrated circuit test elements.
- Integrated Circuit Internal Burst Clock Signal for Fast Testing
An integrated circuit generates an internal burst clock signal to operate at higher frequencies than the external test equipment.
- Heat Spreader Protrusions for Uniform Burn-In Testing
Protrusions extend into sockets to distribute heat evenly, eliminating uneven heating that causes false test results.
- Portable Electrical Testing Apparatus Using Multiplex Switch
Segmented clamping tool and multiplex switch enable portable testing of electronic bonding areas, resolving the trade-off between device size and portability.
- TSV Defect Detection in 3D Semiconductor Stacks
Test voltage application units drive through-silicon vias to output digital logic signals for defect identification.
- Requirements-Based Test Generation for Data Flow Diagrams
Automated test generator creates verification cases from data flow block diagrams using signal propagation and range intersection.
- Contact Configuration for Circuit Board Testing
Spaced contact pairs on opposite sides of a body portion prevent misalignment during connector insertion, ensuring accurate signal transmission.
- Magnetic Circuit for Embedded Tendon Damage Evaluation
Plate-shaped yokes reduce magnetic resistance and apparatus weight, enabling effective damage detection of embedded tendons without exposing the linear body.