Display Device Inspection Wiring Reducing Frame Area
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Solution Overview
Problem
Conventional display devices have an enlarged frame region due to the area required for wiring to turn on inspection transistors, which reduces the aperture ratio in liquid crystal display devices.
Innovation Solution
The display device configuration includes a display region with a frame region, first and second wirings, inspection thin film transistors, and inspection drive circuits, where at least part of the second inspection wiring extends into the display region to reduce the frame area by allowing inspection functions within the display region itself.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If wiring is disposed in the frame region to turn on inspection transistors, then inspection function is achieved, but frame region area is enlarged
Solution Approach 1:
The second inspection wiring extends from the frame region into the display region along the first direction, utilizing the lateral space within the display region to reduce the burden on the frame region. This dimensional redistribution allows inspection functionality to be achieved with minimized frame region occupation.
Solution Approach 2:
The inspection wiring is divided into two parts: the first inspection wiring extending in the second direction within the frame region, and the second inspection wiring extending in the first direction within the display region. This segmentation allows each part to serve its function efficiently while minimizing the overall frame region area required.
2Reliability
If inspection transistors and associated wiring are added, then wiring defect detection is enabled, but device complexity increases
Solution Approach 1:
The inspection transistors share gate electrodes connected to the second inspection wiring, allowing a single wiring structure to control multiple inspection transistors. This multi-functional design enables defect detection across multiple first wirings without proportionally increasing the complexity of control wiring.
Solution Approach 2:
Multiple inspection transistors are controlled through a shared second inspection wiring structure that extends along the first direction, merging the control function for multiple transistors into a single wiring path. This reduces the overall number of independent wiring routes required.
Data Source
AI summary
A display device according to a present disclosure comprises: a display region; a frame region disposed around the display region; a plurality of first wirings extending in a first direction in the display region; a first drive circuit electrically connected to one end of each of the plurality of first wirings; a first inspection wiring electrically connected to another end of each of the plurality of first wirings through each of a plurality of inspection thin film transistors; a second inspection wiring connected to a gate electrode of each of the plurality of inspection thin film transistors; an inspection drive circuit electrically connected to the second inspection wiring; and an inspection circuit electrically connected to the first inspection wiring, wherein at least a part of the second inspection wiring extends in the first direction in the display region.