Functional Backplane Pad Structure for Brittle Solder Joint Control
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Solution Overview
Problem
Existing soldering processes for electronic components on copper connection pads in SMT result in the formation of brittle intermetallic compounds, leading to embrittlement and poor reliability due to rapid diffusion and excessive thickness of intermetallic compounds at the solder joint, which can cause copper deficiency and damage during maintenance.
Innovation Solution
The use of a wiring board with multiple protective layers, including a first reference protective layer capable of forming an intermetallic compound with solder, to control the diffusion of solder and prevent copper deficiency, thereby improving maintainability and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a copper connection pad is used for soldering electronic components, then good electrical conductivity is achieved, but rapid diffusion of solder to the copper pad occurs causing excessive intermetallic compound thickness and embrittlement
Solution Approach 1:
The connection pad structure is segmented into multiple distinct layers: a copper-based main material layer, an intermediate layer, and a protective layer. This segmentation prevents direct contact between solder and copper, controlling diffusion by creating staged barriers that manage intermetallic compound formation at each interface separately.
Solution Approach 2:
An intermediate layer is introduced as a mediator between the copper-based main material layer and the protective layer. This intermediate layer acts as a controlled diffusion barrier, regulating the interaction between solder and copper to prevent excessive intermetallic compound formation while maintaining reliable electrical and mechanical connections.
2Strength
If solder diffusion is allowed to proceed rapidly for strong bonding, then bonding strength is achieved, but intermetallic compounds become excessively thick and brittle causing joint failure
Solution Approach 1:
The diffusion parameters are controlled by changing the material composition and thickness of the protective layer and intermediate layer. By adjusting these parameters, the diffusion rate is optimized to achieve sufficient bonding strength while preventing excessive intermetallic compound growth that would cause brittleness and joint failure.
3Stability of the object's composition
If multiple protective layers are added to control solder diffusion, then intermetallic compound thickness is reduced, but device complexity increases
Solution Approach 1:
The connection pad uses a composite multi-layer structure where each layer has specific material properties optimized for its function. The copper-based main material layer provides conductivity, the intermediate layer controls diffusion, and the protective layer prevents excessive intermetallic compound formation. This composite approach achieves precise control over intermetallic thickness while maintaining manufacturing feasibility.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively slows down the solder diffusion, reduces intermetallic compound thickness, and enhances the mechanical strength of the solder joint, improving maintainability and reliability by preventing copper deficiency and embrittlement.
Implementation Method 1
at least a material of the first reference protective layer is capable of forming a first intermetallic compound with a first solder
Implementation Method 2
the first solder forms the first intermetallic compound with at least the first reference protective layer included in the first electrical connection layer
Data Source
AI summary
A wiring board includes a base substrate and first connection pads disposed on the base substrate. The first connection pads each include electrical connection layer(s); each electrical connection layer includes a main material layer and protective layer(s) disposed on a side of the main material layer away from the base substrate; the protective layer(s) include a first reference protective layer, which is a protective layer farthest away from the base substrate in the protective layer(s); and a material of the main material layer includes copper. The electrical connection layer(s) include a first electrical connection layer, which is an electrical connection layer farthest away from the base substrate in the electrical connection layer(s); and in protective layer(s) in the first electrical connection layer, at least a material of the first reference protective layer is capable of forming a first intermetallic compound with a first solder.


