Multi-view Backscatter Inspection Phase Control
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Solution Overview
Problem
Existing multi-view X-ray backscatter inspection systems face reduced image quality due to mutual interference between radiation sources, leading to a lower average dose rate and inferior image quality when multiple views emit beams simultaneously.
Innovation Solution
A multi-view backscatter inspection system with at least two inspection units and a control device that adjusts the phase difference between radiation beams to separate effective detection areas from interference areas, allowing simultaneous beam emission while minimizing interference and enhancing image quality by using detector arrays with independent detector modules to differentiate and process detection signals effectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple radiation sources emit beams simultaneously in a multi-view backscatter inspection system, then the average dose rate increases and inspection efficiency improves, but mutual interference between radiation sources occurs causing image quality degradation
Solution Approach 1:
The patent applies periodic action by implementing time-multiplexed beam emission where each radiation source emits beams in alternating time intervals rather than simultaneously. The control device coordinates the radiation sources to emit beams periodically, ensuring that at any given moment, only one or a limited number of sources are active, thereby reducing mutual interference while maintaining high overall productivity through continuous operation of multiple sources
Solution Approach 2:
The patent implements preliminary action by pre-coordinating the emission timing of multiple radiation sources through a control device. Before beam emission begins, the system pre-establishes a time-multiplexed schedule that assigns specific time intervals to each radiation source, preventing interference from occurring in the first place while enabling simultaneous operation of multiple sources to maintain high average dose rates
2Loss of information
If multiple radiation sources are used to perform multi-view inspection, then more information of the detection target is obtained, but mutual interference between beam scanning surfaces occurs
Solution Approach 1:
The patent uses periodic action to alternate the activation of multiple radiation sources in time-multiplexed intervals. Each source emits beams during its designated time window, and the control device ensures that sources are activated periodically rather than simultaneously. This approach allows the system to gather information from multiple views while minimizing harmful interference between the beam scanning surfaces of different sources
Solution Approach 2:
The patent applies segmentation by dividing the operation of multiple radiation sources into separate time segments or intervals. Each radiation source is assigned a specific time window for beam emission, creating distinct operational segments that prevent overlap and interference. This temporal segmentation enables the system to maintain multiple views for comprehensive target information while eliminating mutual interference between sources
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively reduces mutual interference between radiation sources, enabling simultaneous beam emission across multiple views and improving the average dose rate and image quality by processing detection signals from specific effective detection areas, resulting in enhanced inspection images.
Implementation Method 1
X-ray backscatter imaging technology is a technique that uses X-ray pencil beam to irradiate an object
Implementation Method 2
performs imaging by detecting a backscatter radiation of the object
Data Source
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AI summary
The present application discloses a multi-view backscatter inspection system and an inspection method. The inspection system comprises an inspection passage, at least two inspection units, a control device and a data processing device. The inspection unit comprises a radiation source and a detector array. The detector array comprises at least two detector modules arranged at different positions and independent of each other. At least two inspection units are arranged so that a radiation beam from any inspection unit is directed to the outside of the detector array of each of the remaining inspection units. The control device adjusts a phase difference between radiation beams of various radiation sources, so that an effective detection area of each of the detector arrays is far away from an interference area. When an inspection image corresponding to certain detector array at certain moment is formed, the data processing device calculates an effective detection area of the detector array at the moment, processes a detection signal from a detector module within the effective detection area and forms an inspection image in which the inspection target is located at one side of the detector array at the moment. The present application may improve the quality of an inspection image.