A scanning microscope generates crystal lattice moiré patterns by detecting signals from virtual lattice points to map periodic structures.
Side and back surface recesses create ergonomic grip zones that resolve the trade-off between compact volume and ease of lifting flat imaging apparatuses.
Coded aperture masks and photon counting detectors enable single step x-ray phase contrast imaging.
A radiation mask with segmented segments attenuates X-ray exposure during printed circuit board defect inspection.
Spectroscopic detectors analyze multi-channel energy spectra to resolve atomic numbers, reducing false alarms from superimposed radiographs.
Segmented conveyor zones isolate alarmed bags for operator verification without halting the entire line, maintaining high throughput and detection reliability.