Backscattering Sensor for Crystallization Degree Detection
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Solution Overview
Problem
Current methods for detecting the degree of crystallization and disperse surface in mediums, especially for non-spherical particles and high concentrations, are inefficient and costly, lacking direct measurement capabilities and requiring complex setups, which hinders process optimization in industries like sugar production.
Innovation Solution
A measuring device emitting primary radiation into the medium to generate secondary radiation, with a spatially limited radiation area and a radiation receiver to detect backscattering, allowing for the quantification of disperse surface changes over time, enabling inline monitoring and process control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If direct light scattering (DLS) measurements are used for particle size analysis, then the setup is simple, but it becomes inapplicable for large particles and non-spherical particles due to anisotropic scattering
Solution Approach 1:
The patent changes the measurement parameter from angular-dependent scattering patterns (anisotropic) to total backscattering intensity (isotropic). By integrating the scattering signal over all angles and using a spherically symmetric detection geometry, the measurement becomes independent of particle shape and orientation, enabling universal application to all particle types while maintaining setup simplicity
Solution Approach 2:
The patent replaces complex mechanical particle analysis systems (such as image analysis or sequential angular scanning) with an optical backscattering measurement system. The key substitution is replacing the need for complex particle-by-particle mechanical or visual inspection with a bulk optical measurement that directly yields dispersed surface area through light scattering intensity
2Measurement precision
If conventional sensors are used to measure dispersed surface area, then measurement is possible, but the sensors are considerably more expensive and complex
Solution Approach 1:
The patent extracts only the essential measurement information (total backscattering intensity) needed to determine dispersed surface area, eliminating the need for complex particle size distribution analysis, shape factor calculations, or multiple measurement angles. This extraction of the core measurable quantity simplifies the sensor design while maintaining measurement precision for the specific parameter of dispersed surface area
Solution Approach 2:
The patent creates a universal measurement principle based on the fundamental relationship between backscattering intensity and dispersed surface area that applies to all particle types, concentrations, and sizes. This universal approach replaces multiple specialized sensors with a single versatile backscattering sensor that can measure dispersed surface area across diverse applications
3Productivity
If crystal concentration is increased to improve yield, then production efficiency increases, but anisotropic scattering behavior makes surface area quantification more difficult
Solution Approach 1:
The patent employs continuous dynamic measurement of backscattering intensity as crystals grow and change concentration in the medium. The real-time monitoring capability allows the system to track dispersed surface area changes during crystallization processes, providing continuous feedback for process optimization despite varying crystal concentrations and anisotropic scattering behaviors
Solution Approach 2:
The patent transforms the measurement approach by changing from particle-specific parameters (individual size and shape) to a bulk parameter (total backscattering intensity proportional to dispersed surface area). This parameter transformation enables accurate measurement even at high crystal concentrations where individual particle characteristics become difficult to resolve
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution provides a cost-effective and efficient means to monitor crystallization processes, offering real-time feedback for dynamic process adjustments, ensuring consistent product quality and minimizing failure rates by quantifying disperse surface changes, thereby improving process efficiency.
Implementation Method 1
due to their anisotropic scattering
Implementation Method 2
the backscattering behavior
Data Source
Figure 1
Figure 2a~3
Figure 4
AI summary
A measurement apparatus is proposed for detecting the degree of crystallization of a medium and/or for detecting the disperse surface in the medium, the measurement apparatus comprising a radiation source for emitting primary radiation into the medium, in particular a light source, wherein the primary radiation is transmitted in a primary beam direction and emerges from the radiation source, wherein the radiation source is configured to radiate the primary radiation into the medium in such a way that a spatially restricted measurement volume is provided in order to generate secondary radiation in the measurement volume, and a radiation receiver for receiving at least some of the secondary radiation generated in the measurement volume, wherein the radiation receiver is located outside the primary beam direction and wherein the radiation receiver is configured to receive and transmit the secondary radiation and/or to output an output signal.