Bias Voltage Frequency Controlled Angular Ion Distribution

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Solution Overview

Problem

Current plasma processing technologies face challenges in precisely controlling the angular distribution of ions, which affects the efficiency and selectivity of processes like etching and deposition, due to limitations in controlling ion energy and angle of incidence on workpieces.

Innovation Solution

The use of a bias voltage frequency, combined with a plasma sheath modifier aperture, allows for the control of ion energy distribution and angular ion distribution by shaping the plasma sheath and modifying the electric field lines, enabling precise control over ion incidence angles and energies.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a grid is placed between the plasma sheath and workpiece to direct ions, then angular ion distribution is controlled, but device complexity increases

Engineering Contradiction:
Improveangular ion distribution controlVSAvoiddevice complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical grid system with an electromagnetic field-based solution. By applying a bias voltage to the workpiece holder, an electric field is generated that directly controls ion acceleration and angular distribution without requiring physical grids or mechanical structures in the plasma path.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent controls ion angular distribution by changing electrical parameters (bias voltage frequency and magnitude) rather than mechanical parameters (grid geometry and position). The bias voltage frequency is specifically adjusted to control the angular spread of ions, providing a more flexible and simpler control mechanism.

Inventive Principle:
Principle #35Parameter changes

2Quantity of substance

If bias voltage is increased to attract more ions, then ion flux increases, but ion energy distribution becomes less controlled

Engineering Contradiction:
Improveion fluxVSAvoidion energy distribution control
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The patent employs dynamic control of the bias voltage by using oscillating RF bias voltage at specific frequencies. This dynamic approach allows the system to control both the quantity and energy distribution of ions simultaneously, as the frequency and amplitude can be independently adjusted to optimize ion flux while maintaining precise energy distribution control.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances process control and selectivity, allowing for more accurate and efficient plasma processing, including anisotropic etching, isotropic etching, and directional film deposition, by tuning the plasma frequency and bias voltage applied to the sheath grid.

Implementation Method 1

The bias voltage generates an electrical field around the workpiece to attract ions through the sheath

Methodology Applied
Scientific EffectElectrical field: Electric Field

Implementation Method 2

The field can accelerate positive ions and repel negative ions and electrons

Methodology Applied
Scientific EffectIon attraction and acceleration: Ion Repulsion/Attraction

Implementation Method 3

The plasma itself is generated using a high voltage power supply and an input gas. The plasma generates a collection of ions and electrons

Methodology Applied
Scientific EffectPlasma: Plasma

Data Source

PatentUS9520267B2Bias voltage frequency controlled angular ion distribution in plasma processing
Publication Date: 2016.12.13 APPLIED MATERIALS INC
  • US9520267B2 patent drawing
  • US9520267B2 patent drawing
  • US9520267B2 patent drawing

AI summary

The angular ion distribution in plasma processing is controlled using a bias voltage frequency. In one example, a plasma containing gas ions is generated in a plasma chamber. The plasma sheath is modified using an aperture disposed between the plasma sheath and the workpiece so that the plasma sheath takes a shape above the aperture. An oscillating radio frequency bias voltage is generated and applied to a workpiece holder. The workpiece holder applies the bias voltage to the workpiece to generate a workpiece bias voltage with respect to the plasma to attract ions across the plasma sheath toward the workpiece. The aperture and the frequency of the bias voltage control an angle at which the ions are attracted toward the workpiece.