Bi-directional Voltage Dry Etching Device for Precision Material Processing

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Solution Overview

Problem

Conventional dry etching methods are limited by chemical processes, restricting their applicability to various materials and precision, and are inefficient in processing time.

Innovation Solution

A dry etching device with a bi-directional voltage power system, including an anode and cathode parts, a leveling part for precise work-piece positioning, and a method involving bi-directional voltage power application to generate plasma for etching, reducing re-deposition and enhancing precision.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional dry etching method with chemical process is used, then etching can be performed, but manufacturing precision deteriorates due to chemical process limitations

Engineering Contradiction:
Improveetching precisionVSAvoidmaterial applicability
Core Design Contradiction:
Manufacturing precisionVSAdaptability or versatility

Solution Approach 1:

The invention changes the fundamental parameter of the etching process from chemical reactions to physical sputtering by ion bombardment. By applying RF power to generate plasma and using physical ejection of material atoms, the method achieves high precision etching while being applicable to diverse materials including metals, semiconductors, and ceramics that are not suitable for chemical etching

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention replaces the chemical process system with a physical field system using plasma and ion bombardment. The etching is achieved through physical sputtering where ions physically eject atoms from the workpiece surface, eliminating chemical reaction limitations and enabling precise control over etching depth and pattern for various materials

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Productivity

If conventional dry etching method is used, then etching process can be completed, but processing time increases due to multiple steps and chemical process limitations

Engineering Contradiction:
Improveprocessing speedVSAvoidetching precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The invention enables continuous etching operation by maintaining stable plasma discharge through RF power application. The plasma generation and ion bombardment process can continue without interruption, allowing high-speed etching while maintaining consistent precision through controlled plasma parameters and continuous monitoring

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The invention uses periodic RF power application to generate plasma cycles that continuously refresh the plasma environment. This periodic plasma generation ensures consistent ion bombardment conditions throughout the etching process, maintaining high precision even during extended high-speed processing

Inventive Principle:
Principle #19Periodic action

3Manufacturing precision

If conventional dry etching method is used, then etching can be performed, but re-deposition of etched materials occurs reducing precision

Engineering Contradiction:
Improveetching precisionVSAvoidetching time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The invention extracts and removes etched material atoms from the processing chamber through physical sputtering and gas flow dynamics. The sputtered atoms are rapidly transported away from the workpiece surface by the plasma environment and gas flow, preventing their re-deposition and ensuring clean, precise etching features without material re-accumulation

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution significantly reduces etching time, improves precision, and allows for the use of diverse materials without re-deposition, enhancing productivity and material applicability.

Implementation Method 1

applying bi-directional voltage power to the cathode part... etching a surface of the work-piece by plasma generated by the bi-directional voltage power applied to the cathode part

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

The work-piece may be attached to the flat plate by using static electricity

Methodology Applied
Scientific EffectStatic electricity: Electrostatics

Data Source

PatentUS11348810B2Dry etching device and method for controlling same
Publication Date: 2022.05.31 VAULT CREATION CO LTD
  • US11348810B2 patent drawing
  • US11348810B2 patent drawing
  • US11348810B2 patent drawing

AI summary

A dry etching device which can be used to etch products or used in processes regardless of materials and exhibits an excellent accuracy, and a method for controlling the same. The dry etching device includes: an anode part; a cathode part disposed at an upper side of the anode part and facing the anode part, receiving bi-directional voltage power in which polarity of a voltage alternates between a positive voltage and a negative voltage depending on time, and spaced apart from the anode part; a leveling part disposed in close contact with a surface of the cathode part facing the anode part, and for positioning a work-piece in a flat state; a holding part for holding the work-piece and the leveling part to the surface of the cathode part facing the anode part; and a bi-directional voltage power supplier for applying the bi-directional voltage power to the cathode part.