Built-In Self-Test Controller for Phase-Independent Time Domain Testing
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Solution Overview
Problem
Traditional testing techniques for mixed-signal IP core systems, particularly for continuous-time sigma-delta converters, face challenges in phase-independent testing and calculating performance metrics in the time domain, especially in complex SoC/SiP architectures where external access is difficult.
Innovation Solution
A built-in self-test (BIST) system that includes a controller configured to receive an output signal from a device under testing (DUT), generate a noise signal, a recovered signal, and a signal-to-noise power ratio, and calculate a performance metric by comparing the signal-to-noise power ratio to a predetermined power threshold, enabling phase-independent testing in the time domain.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If traditional automated test equipment is used for testing mixed-signal IP core systems, then external access and control are possible, but phase-independent testing and time domain performance measurement are difficult to achieve
Solution Approach 1:
The patent introduces a test controller as an intermediary component that interfaces between the device under test and the external testing environment. This controller enables phase-independent testing by processing signals through intermediate representations that eliminate phase dependency, while maintaining external accessibility through standard interfaces.
Solution Approach 2:
The patent replaces traditional frequency-domain measurement approaches with time-domain signal processing mechanisms. By substituting the measurement approach from frequency analysis to time-domain analysis, the system achieves phase-independent performance measurement while maintaining ease of external access through standard test interfaces.
2Device complexity
If traditional testing techniques are used for continuous-time sigma-delta converters, then simple testing architecture is possible, but phase-independent testing and time domain performance calculation are not achievable
Solution Approach 1:
The test controller is designed as a universal testing platform that can evaluate multiple performance metrics of continuous-time sigma-delta converters including signal-to-noise ratio, harmonic distortion, and transient response. This multi-functional approach achieves comprehensive time-domain performance measurement without requiring separate specialized testing systems for each metric.
Solution Approach 2:
The patent changes the measurement parameters from frequency-domain representations to time-domain signal representations. By transforming the measurement approach to operate directly in the time domain with appropriate signal processing, the system achieves phase-independent performance calculation while maintaining manageable architectural complexity through integrated signal processing functions.
3Ease of operation
If external testing equipment is used for complex SoC/SiP architectures, then access to device is possible, but internal IP core testing and phase-independent measurement are difficult
Solution Approach 1:
The test controller enables the device under test to be tested by itself through built-in self-test capabilities. The controller incorporates testing functions that allow internal IP cores to be evaluated without requiring complex external test setups, thereby simplifying the testing process while maintaining accessibility for external equipment through standard interfaces.
Data Source
AI summary
Various embodiments of the present disclosure disclose improved BIST systems and methods for testing digital devices. A method for testing a digital device includes receiving, based at least in part on an input signal, an output signal from a device under testing (DUT). The output signal is processed to generate a noise signal and a recovered signal for the DUT. The controller may generate a signal to noise power ratio based at least in part on the noise and recovered signals and compare the signal to noise power ratio to a predetermined power threshold to generate a performance metric.