Bonded Ceramic Substrate Filling Surface Defects to Prevent Breakdown
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Solution Overview
Problem
Conventional bonded substrates face challenges in preventing electrical breakdown due to partial discharge starting at defects exposed on the surface of silicon nitride ceramic substrates, which are difficult to detect and cannot be easily avoided during shipment.
Innovation Solution
A bonded substrate design where the copper plate and bonding layer fill 80% or more of the volume of particle-defect holes on the ceramic substrate surface, suppressing partial discharge and electrical breakdown by deforming to fit the defect shape during hot pressing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional bonded substrates are used with standard manufacturing processes, then production cost and complexity are controlled, but electrical breakdown occurs due to undetected surface defects causing poor reliability
Solution Approach 1:
The patent applies preliminary action by filling surface defects with bonding material before the actual bonding process. The bonding material is applied to cover defects on the ceramic substrate surface prior to bonding the copper plate, preventing partial discharge from occurring at defect locations during subsequent electrical operation. This advance remediation eliminates the need for complex post-manufacturing defect detection equipment while ensuring reliability.
Solution Approach 2:
The patent converts the harmful effect of surface defects into a beneficial outcome by using the bonding material itself to fill and eliminate the defects. The same bonding material that serves its primary function of joining the copper plate to the ceramic substrate also serves to seal and eliminate surface defects, transforming a potential failure source into a strength. This dual-function approach improves reliability without adding separate defect treatment processes.
2Difficulty of detecting and measuring
If expensive imaging equipment is introduced to detect surface defects, then defect detection capability is improved, but manufacturing cost increases significantly
Solution Approach 1:
The patent extracts the defect detection function from expensive imaging equipment and replaces it with a simple visual inspection method. By designing the process to fill defects with bonding material before bonding, the need for complex detection equipment is eliminated. The bonding material application process itself serves as the detection and remediation mechanism, allowing defects to be identified and corrected through straightforward observation during the bonding preparation stage.
Solution Approach 2:
The patent employs cheap, readily available bonding material to address surface defects instead of investing in expensive imaging equipment. The bonding material, which is already necessary for the bonding process, serves the additional function of defect filling. This approach uses inexpensive, consumable materials to achieve what would otherwise require costly, permanent detection equipment, significantly reducing manufacturing costs while maintaining defect detection capability.
3Reliability
If partial discharge test is conducted on all bonded substrates, then electrical breakdown risk is reduced, but measurement difficulty and equipment cost increase
Solution Approach 1:
The patent applies preliminary action by eliminating the source of partial discharge (surface defects) before electrical testing is needed. By filling defects with bonding material during the bonding process, the substrate is pre-conditioned to prevent partial discharge. This eliminates the need for difficult and expensive partial discharge testing, as the defect-filling action already ensures electrical reliability. The preliminary defect remediation makes subsequent electrical testing straightforward and reliable.
Solution Approach 2:
The patent converts the harmful partial discharge phenomenon into a beneficial quality assurance mechanism. Instead of relying on difficult partial discharge testing to detect potential problems, the bonding material filling process proactively eliminates the conditions that would cause partial discharge. The same bonding material that joins components also prevents electrical breakdown, transforming a testing challenge into an inherent process benefit that ensures reliability without requiring specialized measurement equipment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The design effectively suppresses electrical breakdown at surface defects, ensuring reliable performance by filling the defects with the copper plate and bonding layer, allowing for detection of potential breakdowns through withstand voltage tests before shipment.
Implementation Method 1
the copper plate and bonding layer fill 80% or more of the volume of the particle-defect hole, suppressing partial discharge and electrical breakdown by deforming to fit the defect shape during hot pressing
Implementation Method 2
Silicon nitride ceramics are highly heat conductive... A bonded substrate in which a copper plate is bonded to a silicon nitride ceramic substrate through a bonding layer is thus suitable for use as an insulating heat-dissipating substrate
Implementation Method 3
A bonded substrate includes a ceramic substrate, a copper plate, and a bonding layer... The bonding layer bonds the copper plate to the main surface
Data Source
AI summary
A bonded substrate includes a ceramic substrate, a copper plate, and a bonding layer. The ceramic substrate has a main surface having a flat region having a maximum height Rz of 10 μm or less. The ceramic substrate has a particle-defect hole being exposed to the main surface, imparting flatness lower than flatness of the flat region to a part of the main surface, and having a depth of 10 μm or more and 60 μm or less. The copper plate includes a first portion disposed over the flat region and a second portion filling the particle-defect hole. The bonding layer includes a third portion covering the flat region and a fourth portion filling the particle-defect hole, and the second portion and the fourth portion fill 80% or more of a volume of the particle-defect hole. The bonding layer bonds the copper plate to the main surface.


