Boundary-Scan PCB Connection Testing Without Physical Probes
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current methods for testing connections on printed circuit boards, especially with boundary-scan compliant devices, are complex and time-consuming, requiring skilled users to develop test vectors and involve physical test probes that are impractical with miniaturized ICs and SMDs.
Innovation Solution
A method using an electronic processing unit to retrieve and analyze boundary-scan properties, operating boundary-scan cells as drivers and sensors to test connections between circuit terminals without the need for physical probes, allowing for quick and reliable testing of both galvanic and logical connections using a graphical interface and acoustic signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If multimeter test probes are used to measure connections between circuit terminals, then the testing method is simple and provides immediate feedback, but physical access to the circuit terminals becomes impossible with miniaturized ICs and SMDs
Solution Approach 1:
The patent introduces boundary-scan cells as intermediary components that are already integrated within the ICs. These cells act as mediators between the inaccessible circuit terminals and the testing system, allowing connection testing without direct physical access to the terminals themselves. The boundary-scan cells capture and transfer signal states through existing internal pathways.
Solution Approach 2:
The patent replaces the mechanical probe-based measurement system with an electronic/digital system using boundary-scan technology. Instead of physically touching terminals with multimeter probes, the system uses digital signal transmission through boundary-scan cells to detect connections, substituting mechanical interaction with electronic signal processing.
2Difficulty of detecting and measuring
If conventional boundary-scan testing is used to test connections, then physical test probes are not needed, but the testing process becomes complex and time-consuming requiring skilled users to develop test vectors
Solution Approach 1:
The patent enables the boundary-scan cells to automatically perform the testing function without requiring external test vector development. The existing boundary-scan infrastructure within the ICs is made to serve the connection testing function directly, eliminating the need for separate complex test vector creation and interpretation processes that conventional boundary-scan testing requires.
Solution Approach 2:
The patent makes the boundary-scan cells multi-functional by enabling them to perform both their original function (signal routing and capture) and connection testing function. This universal approach allows the same hardware infrastructure to serve multiple purposes, eliminating the need for dedicated complex testing equipment and procedures.
3Reliability
If conventional boundary-scan testing is used, then comprehensive connection testing is possible, but the testing process requires skilled users and extensive test vector development time
Solution Approach 1:
The patent performs preliminary configuration of the boundary-scan cells during normal device operation or initialization, rather than requiring separate test vector development. The testing capability is pre-established through the boundary-scan infrastructure that is already built into the ICs, allowing immediate use for connection testing without time-consuming setup.
Solution Approach 2:
The boundary-scan cells automatically manage their own state and configuration to perform connection testing, eliminating the need for external skilled operators to create and manage complex test vectors. The system self-configures the testing sequence and automatically interprets results, maintaining reliability while removing the time burden of expert intervention.
Data Source
AI summary
A method of and an arrangement for testing connections on a printed circuit board between boundary-scan compliant circuit terminals of one or more boundary-scan compliant devices mounted at the printed circuit board and comprising a boundary-scan register of boundary-scan cells of the boundary-scan compliant circuit terminals. Under control of an electronic processing unit, boundary-scan properties of the or each boundary-scan compliant device are retrieved, a list comprising boundary-scan compliant circuit terminals is displayed, and a selection of at least a first and second boundary-scan compliant circuit terminal is received. Based on this selection, a boundary-scan cell of a first boundary-scan compliant circuit terminal of a boundary-scan compliant device is operated as a driver and a boundary-scan cell of a second boundary-scan compliant circuit terminal of a boundary-scan compliant device is operated as a sensor. The driver is controlled through data provided to the boundary-scan register. Data sensed by the sensor are latched in the boundary-scan register. The driver and sensor data are analyzed for a connection between the first and the second boundary-scan compliant circuit terminals and the result of the analyses is presented.