Backside-Illuminated Image Sensor Isolation for Crosstalk and Dark Current

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Solution Overview

Problem

Backside illuminated image sensors face increased crosstalk and dark current issues due to reduced pixel region sizes and lattice defects at interfaces between pixel and isolation regions, which affect image quality and resolution.

Innovation Solution

The implementation of light isolation patterns formed in trenches around pixel regions, connected in a lattice form, with an anti-reflective layer and light blocking patterns, and the use of bonding pads to apply a negative voltage to these patterns, reducing light leakage and dark current.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If pixel region size is reduced to increase resolution, then image resolution is improved, but crosstalk between pixels increases

Engineering Contradiction:
Improveimage resolutionVSAvoidcrosstalk
Core Design Contradiction:
Measurement precisionVSObject-generated harmful factors

Solution Approach 1:

The substrate is divided into pixel regions and isolation regions, with trenches formed between adjacent pixel regions. Light isolation patterns are placed within these trenches to physically segment the light paths between pixels, preventing crosstalk while maintaining high resolution.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Light isolation patterns serve as intermediary structures between adjacent pixel regions. These patterns block stray light from reaching neighboring pixels, acting as a mediator that prevents harmful light interference while allowing the pixel regions to remain closely spaced for high resolution.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Object-generated harmful factors

If light isolation patterns are added to reduce crosstalk, then crosstalk is reduced, but device complexity increases

Engineering Contradiction:
ImprovecrosstalkVSAvoidstructure complexity
Core Design Contradiction:
Object-generated harmful factorsVSDevice complexity

Solution Approach 1:

The light isolation patterns are merged with the trench structure, combining the light blocking function with the physical separation structure. This integration reduces the need for separate isolation components, simplifying the overall device structure while maintaining effective crosstalk reduction.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Significantly reduces crosstalk and dark current in backside illuminated image sensors, enhancing image quality and resolution by minimizing light leakage and electron trapping.

Implementation Method 1

an anti-reflective layer formed on the backside surface of the substrate

Methodology Applied
Scientific EffectAnti-reflective coating: Anti-Reflective Coating

Implementation Method 2

a light blocking pattern formed on the anti-reflective layer... light isolation patterns formed among the pixel regions

Methodology Applied
Scientific EffectLight blocking: Absorption (EM radiation)

Data Source

PatentUS20240222412A1Backside illuminated image sensor
Publication Date: 2024.07.04 DONGBU HITEK CO LTD
  • US20240222412A1 patent drawing
  • US20240222412A1 patent drawing
  • US20240222412A1 patent drawing

AI summary

A backside illuminated image sensor includes a substrate having a frontside surface and a backside surface, pixel regions formed in the substrate, light isolation patterns formed among the pixel regions, first bonding pads electrically connected to the pixel regions, and at least one second bonding pad electrically connected to the light isolation patterns.