Back-Scattering Interferometer Simultaneous Refractive Index Measurement

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Solution Overview

Problem

Back-scattering interferometry (BSI) measurements face challenges due to noise from thermal and pressure variations between sample and reference environments, leading to inaccuracies in refractive index determinations, especially when sequential or separate control measurements are required.

Innovation Solution

The development of an interferometric detection system that allows for simultaneous or substantially simultaneous refractive index measurements by using a light beam that impinges multiple discrete zones along a channel, with a closure element to reduce evaporation and a photodetector positioned to receive scattered light, enabling precise determination of refractive index changes without environmental perturbations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If sequential or separate control measurements are used to determine refractive index, then measurement coverage is improved, but measurement precision deteriorates due to temperature changes between measurements

Engineering Contradiction:
Improvemeasurement coverageVSAvoidrefractive index accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent merges the sample measurement and reference measurement into a single simultaneous measurement process using a dual-channel interferometric detection system. Both channels are illuminated by the same light source and detected simultaneously, eliminating temporal separation and ensuring both measurements experience identical environmental conditions, thereby resolving the contradiction between measurement coverage and precision

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent implements preliminary thermal isolation and temperature stabilization of the optical train and measurement chamber before measurements are taken. Temperature regulators maintain constant temperature in advance, preventing temperature drift during sequential or separate measurements, thus ensuring measurement precision while allowing multiple measurements

Inventive Principle:
Principle #10Preliminary action

2Productivity

If separate control measurements are used, then multiple refractive index measurements can be obtained, but measurement precision deteriorates due to environmental variations between measurements

Engineering Contradiction:
Improvenumber of measurementsVSAvoidmeasurement accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent combines multiple measurements into a simultaneous process by using multiple detection channels that operate in parallel within the same environmental conditions. The interferometric system captures reference and sample measurements at the same time, eliminating environmental variations between measurements while maintaining high measurement throughput

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent changes the temporal parameter of measurement from sequential to simultaneous by adjusting the optical configuration to include multiple channels illuminated by the same light source. This parameter change allows multiple measurements to be obtained without environmental drift, resolving the contradiction between measurement quantity and precision

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If a light beam interrogates multiple discrete zones along a channel, then measurement precision is improved by simultaneous measurements, but device complexity increases

Engineering Contradiction:
Improverefractive index determination accuracyVSAvoidinterferometric detection system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the measurement channel into multiple discrete zones along the light propagation direction, with each zone being interrogated by the light beam. This segmentation allows simultaneous measurement of multiple sample regions without requiring multiple separate measurement systems, achieving enhanced precision while managing device complexity through spatial division

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent designs the interferometric detection system with multi-functionality, where a single light source and detection system serve multiple measurement zones simultaneously. The same optical components perform multiple measurement functions by illuminating different regions of the channel, reducing overall device complexity while maintaining high measurement precision

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances measurement precision and reduces noise by allowing multiple refractive index measurements to be taken simultaneously, compensating for thermal and pressure variations, and improving the accuracy of refractive index determinations in BSI systems.

Implementation Method 1

generating scattered light through reflective and refractive interaction of the light beam with a substrate/channel interface and the sample

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 2

generating scattered light through reflective and refractive interaction of the light beam with a substrate/channel interface and the sample

Methodology Applied
Scientific EffectRefraction: Refraction

Implementation Method 3

the scattered light comprising interference fringe patterns elongated in at least one direction

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS11293863B2Robust interferometer and methods of using same
Publication Date: 2022.04.05 FREESRF HOLDINGS LLC
  • US11293863B2 patent drawing
  • US11293863B2 patent drawing
  • US11293863B2 patent drawing

AI summary

Provided are improved optical detection systems and methods for using same, which systems and methods comprise single channel interferometric detection systems and methods for determining a characteristic property of samples. Such interferometric detection systems and methods employ a light beam that impinges two or more discrete zones along a channel, thereby avoiding variations that can result in increases in detection limits and/or measurement errors.