Phase-Affecting Property Measurements TRIZ Cases
- Single-Pixel Electromagnetic Wave Detection Using Spatial Light Modulation
A single pixel detector captures post-modulation intensities to reconstruct complex amplitude information via spatial light modulation.
- Interferometric Surface Profile Correction for Multi-Material Objects
A correction function derived from metallized and non-metallized reference surfaces adjusts interferometric profile signals.
- Photonic Crystal Resonant Support for Infrared Sample Analysis
Segmented photonic crystals on a resonant holder replace mechanical scanning to improve spatial resolution and reduce analysis time.
- Hilbert Phase Microscopy Single-Shot Quantitative Imaging
Hilbert phase microscopy retrieves full-field quantitative phase images from a single spatial interferogram using complex analytic signal formalism.
- Tailored Spatial Coherence iSCAT Microscopy Speckle Suppression
A rotating diffuser mask controls illumination spatial coherence in interferometric scattering microscopy.
- Optical Sensor for Tear Osmolarity via Surface Plasmon Resonance
An optical sensor detects tear osmolarity using surface plasmon resonance at specific incident angles.
- Semiconductor Failure Analysis Using Solid Immersion Lens
A semiconductor failure analysis device uses a gallium arsenide solid immersion lens to increase numerical aperture and reduce spot diameter.
- Temperature Control for Infrared Optical Homogeneity Testing
A dynamic temperature control method minimizes wavefront distortion in infrared optical materials, ensuring refractive index measurement precision.
- Optical Measurement Device Calibration via Reflected Pattern Analysis
A calibration method aligns an imaging lens optical axis with a stage normal direction using reflected light patterns on an image sensor.
- Fabry-Perot Gas Sensor for Kitchen Leak Detection
A Fabry-Perot gas sensor uses optical phase shifts to detect concentrations.
- Micro-lens Multi-well Plate for Rapid Refractive Index Detection
A micro-lens imaging multi-well test plate measures fluid refractive indices through optical refraction patterns.
- Fourier Amplitude Thin Film Thickness Measurement
A Fourier amplitude method extracts ultra-thin film thickness from broadband interferometric spectra without initial substrate guesses.
- Chirped Light Source Spectrometer for Attenuation and Dispersion Measurement
A chirped light source spectrometer splits optical signals into reference and sample paths to generate beat frequency signals.
- Optical Sensor Compensation Element for Fluid Volume Changes
An elastomeric compensation element absorbs fluid volume increases, preventing mechanical stress on the detection portion and maintaining measurement precision.
- Refractive Index Sensor Using Time-Domain Scanning
An adaptive optical scanner measures refractive index through time-domain analysis, eliminating thermal drift and fouling in harsh downhole environments.