Buried Resistors in Buffer Layer for Compound Semiconductor Integration

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Solution Overview

Problem

The semiconductor industry faces challenges in efficiently implementing passive components like resistors in compound semiconductor technologies due to their large layout, which occupies valuable space needed for other components such as FETs, especially when using CMOS technologies.

Innovation Solution

The method involves forming a buried resistor within a buffer layer of a semiconductor device, using a multilayer buffer structure with III-V compound semiconductor materials to minimize mechanical strain and lattice mismatch, allowing for more area in the channel layer for active devices by placing the resistor below the active layer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If resistors are fabricated in the active compound semiconductor material layer or gate material layer, then the resistor can be formed using standard CMOS technologies, but the resistor occupies large layout area that detracts from the area available for constructing other components such as FETs

Engineering Contradiction:
Improveresistor fabricationVSAvoidarea available for FETs
Core Design Contradiction:
Ease of manufactureVSArea of stationary object

Solution Approach 1:

The patent moves the resistor from the two-dimensional plane of the active layer into the third dimension by forming it in the buffer layer below the active layer. This vertical relocation allows the resistor to occupy space in the z-direction rather than competing for lateral area in the x-y plane, effectively resolving the area conflict while maintaining manufacturability through standard semiconductor processing techniques

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Area of stationary object

If the layout area of resistors is reduced to accommodate more FETs, then more area is available for active devices, but the resistor may not achieve sufficient resistance value or may become difficult to fabricate

Engineering Contradiction:
Improvearea for active devicesVSAvoidresistor fabrication
Core Design Contradiction:
Area of stationary objectVSEase of manufacture

Solution Approach 1:

The patent changes the physical parameters of the resistor by forming it in the buffer layer with different material composition and doping characteristics compared to resistors formed in the active layer. This allows the resistor to achieve the required resistance value through vertical positioning and material property adjustments rather than increasing lateral dimensions, thereby maintaining both compact area and manufacturability

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10170464B2Compound semiconductor devices having buried resistors formed in buffer layer
Publication Date: 2019.01.01 INTERNATIONAL BUSINESS MACHINE CORPORATION
  • US10170464B2 patent drawing
  • US10170464B2 patent drawing
  • US10170464B2 patent drawing

AI summary

Structures and methods are provided for fabricating a semiconductor device (e.g., III-V compound semiconductor device) having buried resistors formed within a buffer layer of the semiconductor device. For instance, a semiconductor device includes a buffer layer disposed on a substrate, a channel layer disposed on the buffer layer, and a buried resistor disposed within the buffer layer. The buffer and channel layers may be formed of compound semiconductor materials such as III-V compound semiconductor materials. Utilizing the buffer layer of a compound semiconductor structure to form buried resistors provides a space-efficient design with increased integration density since the resistors do not have to occupy a large amount of space on the active surface of a semiconductor integrated circuit chip.