Burn-in Testing Circuit Delay Component Activation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Burn-in testing for electronic circuits poses challenges in timing closure due to the need for additional hold time buffers, which increase current consumption and require additional design efforts, as the high voltages used during testing cause timing shifts and hold time violations.
Innovation Solution
A circuit design that includes a signal path with a selectively activatable delay component, which is powered only during burn-in testing and disconnected during normal operation, using a multiplexer and control circuit to manage the delay and prevent current draw when not in use.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If hold time buffers are added to compensate for timing shifts during burn-in testing, then timing requirements are met, but current consumption increases
Solution Approach 1:
The delay component's activation state is dynamically changed based on operating conditions. During burn-in testing, the delay component is activated to provide hold time compensation. During normal operation, it is deactivated to avoid unnecessary current consumption. This dynamic adaptation resolves the contradiction by making the timing compensation feature conditional rather than permanent.
Solution Approach 2:
The supply voltage to the delay component is changed based on the operating mode. A control circuit detects whether the circuit is in burn-in mode or normal operation mode, and accordingly adjusts the voltage supply to the delay component - providing power during burn-in testing and disconnecting power during normal operation. This parameter change enables the delay component to fulfill timing requirements only when needed.
2Reliability
If hold time buffers are added during timing closure, then burn-in corner timing is satisfied, but device complexity increases
Solution Approach 1:
The delay component is designed to serve multiple functions: during burn-in testing, it acts as a hold time buffer to satisfy timing requirements; during normal operation, it remains inactive and does not interfere with circuit functionality. The control circuit adds minimal complexity by simply managing the activation state based on operating mode detection.
Solution Approach 2:
The timing compensation function is extracted as a separate, independently controllable delay component rather than being integrated into the main circuit paths. This allows the delay component to be selectively activated only during burn-in testing without permanently modifying the normal operation paths, thereby reducing overall device complexity.
3Reliability
If delay components are permanently integrated into the circuit, then timing is correct during burn-in, but normal operation is significantly influenced
Solution Approach 1:
The delay component's activation state is dynamically changed based on operating conditions. During burn-in testing, the delay component is activated to provide hold time compensation. During normal operation, it is deactivated to avoid unnecessary current consumption. This dynamic adaptation resolves the contradiction by making the timing compensation feature conditional rather than permanent.
Data Source
AI summary
Circuits and methods are provided for a signal path between circuit parts. During normal operation, a delay is deactivated. During a burn-in test, the delay is activated. In the deactivated state, a delay component may be disconnected from a supply voltage.