Electronic Circuit Testing TRIZ Cases
- Multiplexer-Based Test System for IC Pin Routing
A test system uses multiplexers to route signals from tester pins to device pins.
- Semiconductor Chip Temperature Control Using Parasitic Diode
A semiconductor chip uses a parasitic diode to measure its own temperature during probe testing.
- Long-Time-Constant Circuit Testing via Effective Resistance Calibration
Testing circuit measures effective resistance of discharge element to calibrate discharge interval duration.
- Wiring Board Warping Suppression via Ceramic Resin Composite
Brazing metal members to joint pads on resin boards maintains joint strength across heat cycles while the composite structure prevents warping.
- Semiconductor Module Usability Prediction via Thermal Resistance
A semiconductor module determines remaining usability by sensing element temperature under predefined electrical load and cooling conditions.
- TSV Signal Delay Compensation in Stacked Semiconductor Chips
Correction circuits calculate position-based delays to adjust input signals, minimizing skew from parasitic TSV capacitance.
- Line Testing Device for Dense Array Substrates
Moving signal sensors perpendicular to scan lines isolates detection circuits and reduces wire interference in dense array substrates.
- Embedded Memory Virtual Entry for Scan Testability
Virtual entry with scan-controllable storage elements applies transition data to embedded memory read paths.
- Loop-back Probe Verification via Patterned Conductive Substrate
A probe card analyzer uses a patterned conductive substrate to verify electrical continuity between loop-back probes.
- Interface Module Identification via Resistance Detection
Signal processing apparatus identifies interface modules using detection resistance and voltage changes.
- Virtualized I/O Resource Discovery Table for Isolation
A virtualized I/O device uses a resource discovery table to allocate hardware resources to specific processes.
- RF Signal Testing Structure on PCB Without High Frequency Switches
A printed circuit board testing structure with a dedicated point and grounding element enables accurate radio frequency signal measurement.
- BIST Address Generator for Memory Test Time Reduction
A BIST address generator produces selective test patterns to verify memory integrity without exhaustive coverage.
- Finite State Machine Controller Synchronization via Readiness Voting
Readiness voting among asynchronous finite state machines prevents synchronization loss and catastrophic failures during state transitions.
- Semiconductor Test Circuit Isolation for TDDB Accuracy
A semiconductor test circuit uses input and protection switches to isolate a test transistor from the main circuit during stress voltage application.
- Burn-in Testing Circuit Delay Component Activation
Activating a delay component only during burn-in testing resolves timing closure issues without increasing normal operation current consumption.
- Scan Test Encoder for Multi-Domain IC Clock Synchronization
An encoder selectively forwards capture pulses to specific clock domains during scan testing of integrated circuits.
- Multi-Chip Module Segmentation for FPGA Yield Optimization
Segmenting large FPGAs into smaller dies reduces defect probability while maintaining functionality through modular architecture.
- Switchgear Abnormal Electrical Connection Detection via Normalized Temperature Rise
A detecting method normalizes temperature rise values to identify abnormal electrical connections in switchgear main circuits.
- Integrated Current Sense Resistor Using Metal-on-Passivation Layer
Integrating a current sense resistor into the semiconductor package eliminates external components and reduces Seebeck effect errors.
- Temperature-Controlled Module for Electronic Devices Preventing Condensation
A temperature-controlled module uses a fluid chamber and dry air to rapidly cool electronic devices without surface condensation.
- Noise Measurement Using FFT and Parseval's Theorem
A noise measurement system converts time domain signals to frequency domain data using Fast Fourier Transform.
- Semiconductor Test Jig with Movable Ground Block for Stable Contact
Movable ground blocks in this test jig adapt to lead dimensional variations, ensuring reliable contact without deforming the leads during testing.
- Thermal Interface Material Aging Test System
Aging test system moves thermal interface material against a heat source to measure conductivity changes.
- API Usage Tool for Multiplatform Web Service Compatibility Testing
An API usage tool identifies method calls in source code and compares them against compiled usage guidelines to mark conflicts.
- Distributed Clock Dividers for Delay Fault Testing in Multi-Domain ICs
On-chip test control circuitry generates launch and capture pulses via distributed clock dividers to identify delay faults across multiple clock domains.