Multiplexer-Based Test System for IC Pin Routing
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Solution Overview
Problem
Conventional test systems for integrated circuits require multiple connections and disconnections to different test equipment for structural, functional, and parametric testing, making the process time-consuming and costly due to the need for repeated device insertions into separate sockets for each test type.
Innovation Solution
A test system incorporating multiplexers that allow for multiple tests to be performed on devices without disconnecting them from the socket, utilizing a single tester with multiplexers to route signals from a limited number of tester pins to all device pins, enabling simultaneous execution of structural, functional, and parametric tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple separate test equipments are used for structural, functional, and parametric testing, then each test can be performed with specialized equipment, but the testing process becomes time-consuming due to repeated device insertions and disconnections
Solution Approach 1:
The patent combines multiple separate test equipments (structural test equipment, functional test equipment, and parametric test equipment) into a single integrated test system. This consolidation allows all three test types to be performed on a device simultaneously or sequentially without removing the device from the socket, thereby eliminating repeated insertions and disconnections while maintaining specialized testing capabilities through the use of multiplexers that route signals appropriately.
Solution Approach 2:
The test system is designed with multi-functionality to perform structural testing, functional testing, and parametric testing using a single piece of equipment. The system includes a socket that can accommodate devices and multiplexers that enable different test signals to be routed to appropriate device pins, allowing one test equipment to serve multiple testing purposes that previously required separate specialized equipments.
2Reliability
If multiple separate test equipments are used for different test types, then each test can be performed with appropriate equipment, but the requirement for different equipment increases costs
Solution Approach 1:
The patent consolidates multiple separate test equipments into a single integrated test system, reducing the total number of equipment pieces required. By merging structural test equipment, functional test equipment, and parametric test equipment into one system with shared components (socket, multiplexers, control unit), the overall equipment complexity is reduced while maintaining the capability to perform all three test types with appropriate accuracy.
3Ease of operation
If a single tester is used for all test types, then device handling is simplified, but the tester requires complex signal routing capabilities
Solution Approach 1:
The patent introduces multiplexers as intermediary components between the tester pins and the device pins. These multiplexers act as mediators that intelligently route different test signals to the appropriate device pins based on the type of test being performed. This intermediary layer simplifies the tester's operation by providing a unified interface while managing the complexity of signal routing internally through the multiplexer switching logic.
Data Source
AI summary
A test system for performing a plurality of tests on a plurality of devices includes a tester having a plurality of tester pins and at least one socket, wherein the plurality of devices are received in the at least one socket. The test system further includes a plurality of multiplexers, wherein each of the multiplexers has an input coupled to one of the plurality of tester pins and each of the multiplexers has outputs coupled to individual device pins of the devices. The tester is configurable to perform a first test on a first plurality of devices and a second test on a second plurality of devices without disconnecting the devices from the at least one socket.