C-Shaped Confinement Ring for Plasma Chamber Pressure Control

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Solution Overview

Problem

In plasma processing chambers, maintaining optimal chamber pressure is crucial to prevent etch stop or plasma extinguishment, yet existing systems face challenges in effectively controlling pressure and confining plasma, especially in medium density chambers like parallel plate plasma processing chambers.

Innovation Solution

A confinement ring with an extended plasma confinement zone is introduced, featuring an upper annular wall, vertical sidewall, and lower annular wall with radially extending slots to manage pressure and plasma confinement between the upper and lower electrodes, enhancing plasma stability and gas exhaust.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If chamber pressure is increased to sustain plasma, then plasma generation is improved, but etch stop occurs

Engineering Contradiction:
Improveplasma generationVSAvoidetch rate
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The confinement ring is divided into multiple functional segments: an upper confinement surface for plasma containment, a lower confinement surface with slots for gas exhaust, and a C-shaped configuration that segments the chamber volume. This segmentation allows different regions to perform different functions - plasma generation and containment in the upper region, and gas removal in the lower region - enabling simultaneous maintenance of plasma and prevention of etch stop.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The confinement ring introduces local quality variations through its C-shaped geometry and slot distribution. The upper surface provides a smooth confinement zone for plasma stability, while the lower surface incorporates slots at specific locations to enhance gas exhaust. This local differentiation allows the system to maintain plasma in certain zones while actively removing gas in other zones, resolving the contradiction between plasma sustenance and etch rate maintenance.

Inventive Principle:
Principle #3Local quality

2Productivity

If chamber pressure is decreased to prevent etch stop, then etch rate is maintained, but plasma extinguishment occurs

Engineering Contradiction:
Improveetch rateVSAvoidplasma generation
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The confinement ring acts as an intermediary structure between the plasma generation zone and the chamber wall. It provides a controlled interface that allows plasma to be sustained close to the substrate while facilitating gas removal through its slots. This intermediary structure enables the system to operate at lower pressures without plasma extinguishment by providing a localized environment that supports plasma stability.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The C-shaped confinement ring introduces a new spatial dimension for plasma control. By extending vertically and incorporating both upper and lower confinement surfaces, it creates a three-dimensional plasma confinement zone that enhances plasma stability without requiring high chamber pressure. The vertical extension and slot configuration provide additional degrees of freedom for controlling plasma behavior at lower pressures.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If conventional confinement structures are used, then device complexity is low, but plasma confinement effectiveness is insufficient

Engineering Contradiction:
Improveplasma confinementVSAvoidconfinement structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The confinement ring is designed as a multi-functional component that simultaneously performs plasma confinement, gas exhaust, and structural support functions. The C-shaped structure provides both upper and lower confinement surfaces, while the integrated slots handle gas removal. This multi-functionality reduces the need for separate components, maintaining relatively simple device architecture while achieving effective plasma confinement.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The C-shaped confinement ring is positioned within the existing chamber structure, nesting between the substrate support and chamber wall. This nested configuration allows the confinement ring to utilize the existing chamber geometry, minimizing additional structural complexity. The ring fits into the available space without requiring major modifications to the chamber design, achieving enhanced plasma confinement with minimal increase in device complexity.

Inventive Principle:
Principle #7Nested doll (Nesting)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively maintains optimal chamber pressure and confines plasma, preventing etch stop and plasma extinguishment, thereby improving the accuracy and repeatability of substrate processing in plasma processing chambers.

Implementation Method 1

inner surfaces of the confinement ring provide an extended plasma confinement zone surrounding a gap between an upper electrode and a lower electrode

Methodology Applied
Scientific EffectPlasma confinement: Physical Containment

Implementation Method 2

the slots being evenly spaced at radial positions offset by no more than 2°

Methodology Applied
Scientific EffectGas flow through slots: Fluid Spray

Data Source

PatentUS8826855B2C-shaped confinement ring for a plasma processing chamber
Publication Date: 2014.09.09 LAM RES CORP
  • US8826855B2 patent drawing
  • US8826855B2 patent drawing
  • US8826855B2 patent drawing

AI summary

Described herein is a confinement ring useful as a component of a capacitively-coupled plasma processing chamber. Inner surfaces of the confinement ring provide an extended plasma confinement zone surrounding a gap between an upper electrode and a lower electrode on which a semiconductor substrate is supported during plasma processing in the chamber.